| Presentation | 2004/2/13 Classification of Sequential Circuits Based on Combinational Test Generation Complexity Chia Yee OOI, Hideo FUJIWARA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we introduce a new test generation notation called τ^k notation, which consists of τ^k-equivalent and τ^k-bounded, in order to clarify the classification of sequential circuits based on combinational test generation complexity. We reconsider the test generation complexity for the existing classes of acyclic sequential circuits. We also propose FSR scan design technique as a DFT method and examine the test generation complexity for the augmented circuits. Three classes of sequential circuits that cover some cyclic sequential circuits have been identified as being T-equivalent and τ^k-bounded. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | test generation complexity / τ^k notation / easily testable / design for testability |
| Paper # | DC2003-101 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2004/2/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Classification of Sequential Circuits Based on Combinational Test Generation Complexity |
| Sub Title (in English) | |
| Keyword(1) | test generation complexity |
| Keyword(2) | τ^k notation |
| Keyword(3) | easily testable |
| Keyword(4) | design for testability |
| 1st Author's Name | Chia Yee OOI |
| 1st Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology Kansai Science City() |
| 2nd Author's Name | Hideo FUJIWARA |
| 2nd Author's Affiliation | Graduate School of Information Science, Nara Institute of Science and Technology Kansai Science City |
| Date | 2004/2/13 |
| Paper # | DC2003-101 |
| Volume (vol) | vol.103 |
| Number (no) | 668 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |