Presentation 2004/2/13
A DFT Selection Method for Reducing Test Application Time of System-on-Chips
Masahide MIYAZAKI, Toshinori HOSOKAWA, Hiroshi DATE, Michiaki MURAOKA, Hideo FUJIWARA,
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Abstract(in English) This paper proposes an SoC test architecture generation framework. It contains a database which stores the test cost information on several DFTs for every core, and DFT selection part which performs DFT selection for test cost minimization using this database in the early phase of the design flow. Moreover, the DFT selection problem is formulated and the algorithm which solves this is proposed. Experimental results showed that bottlenecks in test application time when using the single DFT method for all cores is reduced by performing DFT selection from several DFTs. As a result, the whole test application time is drastically shortened.
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Keyword(in English) test scheduling / test access mechanism / wrapper / design for test
Paper # DC2003-100
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Conference Date 2004/2/13(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A DFT Selection Method for Reducing Test Application Time of System-on-Chips
Sub Title (in English)
Keyword(1) test scheduling
Keyword(2) test access mechanism
Keyword(3) wrapper
Keyword(4) design for test
1st Author's Name Masahide MIYAZAKI
1st Author's Affiliation STARC()
2nd Author's Name Toshinori HOSOKAWA
2nd Author's Affiliation Mathematical Information Engineering, Nihon University
3rd Author's Name Hiroshi DATE
3rd Author's Affiliation STARC
4th Author's Name Michiaki MURAOKA
4th Author's Affiliation STARC
5th Author's Name Hideo FUJIWARA
5th Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology (NAIST)
Date 2004/2/13
Paper # DC2003-100
Volume (vol) vol.103
Number (no) 668
Page pp.pp.-
#Pages 6
Date of Issue