| Presentation | 2004/2/13 Random Access Scan : A solution to test power, test data volume and test time Dong Hyun BAIK, Kewal K. SALUJA, Seiji KAJIHARA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Adherence to serial scan is preventing the researchers from investigating alternative design for test techniques that may offer larger test benefit at the cost of some what higher overhead. In this paper, we investigate the use of random access scan for simultaneous reduction of test power, test data volume and test application time. We provide an asymmetric traveling salesman formulation of these problems to minimize random access scans and the test data. Application of our method results into nearly 3x speedup in test application time, 60% reduction in test data volume and over 99% reduction in power consumption for benchmark circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | scan design / design for testability / test cost reduction |
| Paper # | DC2003-98 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2004/2/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | ENG |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Random Access Scan : A solution to test power, test data volume and test time |
| Sub Title (in English) | |
| Keyword(1) | scan design |
| Keyword(2) | design for testability |
| Keyword(3) | test cost reduction |
| 1st Author's Name | Dong Hyun BAIK |
| 1st Author's Affiliation | Univ. of Wisconsin-Madison, Dept. of Electrical and Computer Engineering() |
| 2nd Author's Name | Kewal K. SALUJA |
| 2nd Author's Affiliation | Univ. of Wisconsin-Madison, Dept. of Electrical and Computer Engineering |
| 3rd Author's Name | Seiji KAJIHARA |
| 3rd Author's Affiliation | Kyushu Institute of Technology, Dept. of Computer Sciences and Electronics |
| Date | 2004/2/13 |
| Paper # | DC2003-98 |
| Volume (vol) | vol.103 |
| Number (no) | 668 |
| Page | pp.pp.- |
| #Pages | 7 |
| Date of Issue | |