Presentation 2004/2/13
A Test Vector Ordering for Overhead Reduction of Test Decompressors
Masakuni OCHI, Michihiro SHINTANI, Hideyuki ICHIHARA, Tomoo INOUE,
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Abstract(in English) Test compression / decompression scheme using Huffman coding is efficient in reducing the test application cost, i.e., the test application time and the size of the storage on an LSI tester. The authors in literature [14] have proposed an architecture of an embedded decompressor with a buffer for this scheme. In this paper, we propose a method for reducing the size of the buffer in the embedded decompressor. Since the buffer size depends on the input order of test vectors, we propose an algorithm for ordering test vectors in order to reduce the size of the buffer. The algorithm is based on fluctuations in buffered data for each test vector. Experimental results show a case where the ordering algorithm can reduce the size of the buffer by 97%.
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Keyword(in English) Test compression / Huffman coding / embedded decompressor / buffer / test vector / and ordering
Paper # DC2003-97
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Committee DC
Conference Date 2004/2/13(1days)
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Paper Information
Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Test Vector Ordering for Overhead Reduction of Test Decompressors
Sub Title (in English)
Keyword(1) Test compression
Keyword(2) Huffman coding
Keyword(3) embedded decompressor
Keyword(4) buffer
Keyword(5) test vector
Keyword(6) and ordering
1st Author's Name Masakuni OCHI
1st Author's Affiliation Faculty of Information Sciences, Hiroshima City University()
2nd Author's Name Michihiro SHINTANI
2nd Author's Affiliation Graduate School of Information Sicences, Hiroshima City University
3rd Author's Name Hideyuki ICHIHARA
3rd Author's Affiliation Faculty of Information Sciences, Hiroshima City University
4th Author's Name Tomoo INOUE
4th Author's Affiliation Faculty of Information Sciences, Hiroshima City University
Date 2004/2/13
Paper # DC2003-97
Volume (vol) vol.103
Number (no) 668
Page pp.pp.-
#Pages 6
Date of Issue