| Presentation | 2004/2/13 Analog LSI Relation Among Measurement Accuracy, Yield, and Test Time Hideo KOHlNATA, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As the integration of LSI is getting rapidly higher and circuit size is getting bigger, the bigger LSI test cost due to longer test time in LSI production becomes more serious. This paper will discuss how much impact Mixed LSI measurement accuracy affects test time and LSI yield analyzing the actual results in production test. It will be practical and effective example to the semiconductor industry to show the actual relation among measurement accuracy, test time, and yield based on the actual test data. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Test Time / Yield / Measurement Accuracy / Analog LSI / FFT / DSP |
| Paper # | DC2003-93 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2004/2/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analog LSI Relation Among Measurement Accuracy, Yield, and Test Time |
| Sub Title (in English) | |
| Keyword(1) | Test Time |
| Keyword(2) | Yield |
| Keyword(3) | Measurement Accuracy |
| Keyword(4) | Analog LSI |
| Keyword(5) | FFT |
| Keyword(6) | DSP |
| 1st Author's Name | Hideo KOHlNATA |
| 1st Author's Affiliation | Automated Test Group, Agilent Technologies Japan Ltd.() |
| Date | 2004/2/13 |
| Paper # | DC2003-93 |
| Volume (vol) | vol.103 |
| Number (no) | 668 |
| Page | pp.pp.- |
| #Pages | 4 |
| Date of Issue | |