| Presentation | 2004/2/13 Diagnosis for Single/Multiple Stuck-at Faults by Ambiguous Diagnostic Test Set Yukihiro YAMAMOTO, Hidekazu AYANO, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Yuzo TAKAMATSU, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we propose a method for diagnosing stuck-at faults under Built-in Self-Test(BIST) environment. Fault diagnosis under BIST environment is more difficult because only limited information for making the diagnostic test set is available in highly compacted signatures. Therefore the detecting test set that is identified in BIST session includes un-detecting tests. We have proposed a method for identifying candidate faults based on the ambiguous diagnostic test set [10]. In this paper, we introduce two diagnostic methods to reduce the number of candidate faults. First diagnostic method uses the detection times for candidate faults to check whether the candidate fault remains in the set of candidate faults or not. Second diagnositc method uses the first detection test to diagnose the candidate faults along paths. Moreover, we propose an extended method for diagnosing multiple stuck-at faults by using test-pairs. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | BIST / fault diagnosis / stuck-at faults / first detection test / test-pairs |
| Paper # | DC2003-91 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2004/2/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Diagnosis for Single/Multiple Stuck-at Faults by Ambiguous Diagnostic Test Set |
| Sub Title (in English) | |
| Keyword(1) | BIST |
| Keyword(2) | fault diagnosis |
| Keyword(3) | stuck-at faults |
| Keyword(4) | first detection test |
| Keyword(5) | test-pairs |
| 1st Author's Name | Yukihiro YAMAMOTO |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Hidekazu AYANO |
| 2nd Author's Affiliation | Graduate School of Science and Engineering, Ehime University |
| 3rd Author's Name | Hiroshi TAKAHASHI |
| 3rd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 4th Author's Name | Yoshinobu HIGAMI |
| 4th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 5th Author's Name | Yuzo TAKAMATSU |
| 5th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| Date | 2004/2/13 |
| Paper # | DC2003-91 |
| Volume (vol) | vol.103 |
| Number (no) | 668 |
| Page | pp.pp.- |
| #Pages | 6 |
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