| Presentation | 2004/2/13 Diagnosis for Open Faults Based on Detecting/Un-detecting Information on Tests Yuichi SATO, Hiroshi TAKAHASHI, Yoshinobu HIGAMI, Yuzo TAKAMATSU, |
|---|---|
| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | With the scaling of LSI feature size and increasing layers of metal interconnects, both test and diagnosis for open faults have become important problems. Development of BIST-based diagnosis for open faults is demanded because BIST is as effective in testing. Under BIST environment, it is difficult to know which primary output has faulty response on the application of a detecting test. Therefore, we propose the diagnostic method for single open fault at a fan-out stem, based on only detecting/un-detecting information on tests. Our method deduces candidate fan-out stems based on the detection times for single stuck-at fault at each fan-out branch, by performing single stuck-at fault simulation with both detecting and un-detecting tests. Furthermore, to improve the diagnosability, the method reduces the candidate fan-out stems based on detection times for multiple stuck-at faults at fan-out branches that are connected to the candidate fan-out stem, by performing multiple stuck-at fault simulation with detecting tests. Experimental results show that the proposed method diagnosis faults within 15 candidate fan-out stems except one circuit in ISCAS'85 and 89 benchmark circuits. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | fault diagnosis / open faults / detecting tests / un-detecting tests / candidate faults |
| Paper # | DC2003-90 |
| Date of Issue |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2004/2/13(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | |
| Vice Chair | |
| Secretary | |
| Assistant | |
| Paper Information | |
| Registration To | Dependable Computing (DC) |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Diagnosis for Open Faults Based on Detecting/Un-detecting Information on Tests |
| Sub Title (in English) | |
| Keyword(1) | fault diagnosis |
| Keyword(2) | open faults |
| Keyword(3) | detecting tests |
| Keyword(4) | un-detecting tests |
| Keyword(5) | candidate faults |
| 1st Author's Name | Yuichi SATO |
| 1st Author's Affiliation | Graduate School of Science and Engineering, Ehime University() |
| 2nd Author's Name | Hiroshi TAKAHASHI |
| 2nd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 3rd Author's Name | Yoshinobu HIGAMI |
| 3rd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 4th Author's Name | Yuzo TAKAMATSU |
| 4th Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| Date | 2004/2/13 |
| Paper # | DC2003-90 |
| Volume (vol) | vol.103 |
| Number (no) | 668 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |