| Presentation | 2003/11/21 Multiple Scan Tree Design for Test Compression Kohei MIYASE, Seiji KAJIHARA, Sudhakar M. REDDY, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we propose a method of test compression for multiple scan designs. Instead of the conventional serial scan chains, the proposed method constructs scan trees in which scan flip-flops are placed and routed in a tree structure. Inputs of the scan trees drive several scan trees of different lengths (height). Since test data volume and test application time are dominated by the scan tree with the maximum height among the constructed scan trees, the proposed method distributes the scan flip-flops to the scan trees so as to minimize the maximum height of the scan trees. In addition, the proposed method modifies the given test vectors to maximize the reduction in test data volume and test application time. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce, on the average, test data volume by 77% compared with the conventional multiple scan design. The scan tree construction enlarges the number of scan outputs required. However test data volume could be reduced by 62% even if the number of scan outputs is limited. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | scan tree, multiple scan design / test vector modification / don't-care |
| Paper # | DC2003-40 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2003/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Multiple Scan Tree Design for Test Compression |
| Sub Title (in English) | |
| Keyword(1) | scan tree, multiple scan design |
| Keyword(2) | test vector modification |
| Keyword(3) | don't-care |
| 1st Author's Name | Kohei MIYASE |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Seiji KAJIHARA |
| 2nd Author's Affiliation | Kyushu Institute of Technology |
| 3rd Author's Name | Sudhakar M. REDDY |
| 3rd Author's Affiliation | University of Iowa |
| Date | 2003/11/21 |
| Paper # | DC2003-40 |
| Volume (vol) | vol.103 |
| Number (no) | 480 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |