| Presentation | 2003/11/21 On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume Siji KAJIHARA, Yasumi DOI, Lei LI, Krishnendu CHAKRABARTY, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique. Before encoding a given set of test patterns, we selectively relax some specified bits of the test patterns. By changing a specified bit with value 0 to a don't-care, two consecutive runs of Os in the test sequence can be concatenated into a longer run of 0, thereby facilitating run-length coding. This procedure retains the fault coverage of the test set. Since the increase in compression depends on the lengths of the two runs that are concatenated with each bit relaxation, by pre-computing the increase in compression, we pinpoint the bit positions with value 1, which when relaxed to don't-cares, will yield the most compression. In this way, the given test pattern set is appropriately modified as a preprocessing step before test compression. Experimental results for the ISCAS benchmark circuits show that the proposed method could reduce, on the average, test data volume by 55%. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | run-length codes / test modification / don't-care |
| Paper # | DC2003-39 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2003/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume |
| Sub Title (in English) | |
| Keyword(1) | run-length codes |
| Keyword(2) | test modification |
| Keyword(3) | don't-care |
| 1st Author's Name | Siji KAJIHARA |
| 1st Author's Affiliation | Kyushu Institute of Technology() |
| 2nd Author's Name | Yasumi DOI |
| 2nd Author's Affiliation | Kyushu Institute of Technology |
| 3rd Author's Name | Lei LI |
| 3rd Author's Affiliation | Duke University |
| 4th Author's Name | Krishnendu CHAKRABARTY |
| 4th Author's Affiliation | Duke University |
| Date | 2003/11/21 |
| Paper # | DC2003-39 |
| Volume (vol) | vol.103 |
| Number (no) | 480 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |