Presentation 2003/11/21
Program-Based Delay Fault Self-Testing of Processor Cores
Virendra Singh, Michiko Inoue, Kewal K Saluja, Hideo Fujiwara,
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Abstract(in English) This paper proposes an efficient methodology of delay fault testing of processor cores using its instruction set. These test vectors can be applied in the functional mode of operation, hence, self-testing of processor core becomes possible. A delay fault will affect the circuit functionality only when it can be activated in functional mode. There are some paths, which are never excited in the functional mode of operation; hence these are functionally untestable paths. The proposed approach uses a graph theoretic model (represented as an Instruction Execution Graph) of the datapath and a finite state machine model of the controller for the elimination of functionally untestable paths at the early stage without looking into the circuit details and extraction of constraints for the the paths that can potentially be tested. Path delay fault model is used. The experimental results on Parwan processor demonstrate the effectiveness of our method.
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Paper # DC2003-37
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Conference Date 2003/11/21(1days)
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Language ENG
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Title (in English) Program-Based Delay Fault Self-Testing of Processor Cores
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1st Author's Name Virendra Singh
1st Author's Affiliation Nara Institute of Science & Technology, Ikoma:Central Electronics Engineering Research Institute()
2nd Author's Name Michiko Inoue
2nd Author's Affiliation Nara Institute of Science & Technology, Ikoma
3rd Author's Name Kewal K Saluja
3rd Author's Affiliation University of Wisconsin - Madison, U.S.A
4th Author's Name Hideo Fujiwara
4th Author's Affiliation Nara Institute of Science & Technology, Ikoma
Date 2003/11/21
Paper # DC2003-37
Volume (vol) vol.103
Number (no) 480
Page pp.pp.-
#Pages 6
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