| Presentation | 2003/11/21 An Improvement of the Test Plan Generation Algorithm for Strongly Testable Datapaths Naoki OKAMOTO, Hideyuki ICHIHARA, Tomoo INOUE, Toshinori HOSOKAWA, Hideo FUJIWARA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Hierarchical test generation [2] is an efficient method of test generation for VLSI circuits. In this work, we study an improvement of the DFT method [3] based on strong testability of Register-Transfer level (RTL) datapaths. We focus on the algorithm, which is a part of the DFT/test plan generation algorithm [3], for generating a controlling forest in a given RTL datapath, we propose a heuristic algorithm for finding a controlling forest without time conflict. As a result, it can reduce the number of registers with hold operation. Furthermore, we show that our proposed algorithm can be applied to datapaths that do not satisfy the constraint for the previous method [3] , by expressing the information about input registers of a module as a measure of time conflict. Experimental results show that the proposed algorithm is effective in reducing additional hold functions(or hardware overhead), as well as test application time. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Hierarchical test generation / strong testability / datapath / test plan |
| Paper # | DC2003-36 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2003/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | An Improvement of the Test Plan Generation Algorithm for Strongly Testable Datapaths |
| Sub Title (in English) | |
| Keyword(1) | Hierarchical test generation |
| Keyword(2) | strong testability |
| Keyword(3) | datapath |
| Keyword(4) | test plan |
| 1st Author's Name | Naoki OKAMOTO |
| 1st Author's Affiliation | Graduate School of Information Sciences, Hiroshima City University() |
| 2nd Author's Name | Hideyuki ICHIHARA |
| 2nd Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| 3rd Author's Name | Tomoo INOUE |
| 3rd Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
| 4th Author's Name | Toshinori HOSOKAWA |
| 4th Author's Affiliation | College of Industrial Technology, Nihon University |
| 5th Author's Name | Hideo FUJIWARA |
| 5th Author's Affiliation | Graduate School of Info. Science, Nara Institute of Science and Technology |
| Date | 2003/11/21 |
| Paper # | DC2003-36 |
| Volume (vol) | vol.103 |
| Number (no) | 480 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |