Presentation 2003/2/14
A Test Compression for Test Application Based on Huffman Coding
Toshihiro OHARA, Michihiro SHINTANI, Hideyuki ICHIHARA, Tomoo INOUE, Akio TAMURA,
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Abstract(in English) Test compression/decompression method using Huffman coding is an efficient method for reducing the test application cost, i. e., test application time and the size of the storage of a LSI tester. Previous works for the method, however, do not discuss the test application time adequately. In this paper, we clarify the fact that it depends on the compression ratio and the minimum length of cord words of an encoded test data, and then propose a new test compression method for reducing test application time based on Huffman coding. The proposed compression method can reduce test application time because it can optimize both of the compression ratio and the minimum length of the cord words. Experimental results show that the proposed method can reduce test application time appropriately.
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Keyword(in English) Huffman code / test compression / test application / complete binary tree
Paper # DC2002-90
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Committee DC
Conference Date 2003/2/14(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Test Compression for Test Application Based on Huffman Coding
Sub Title (in English)
Keyword(1) Huffman code
Keyword(2) test compression
Keyword(3) test application
Keyword(4) complete binary tree
1st Author's Name Toshihiro OHARA
1st Author's Affiliation Faculty of Information Sciences, Hiroshima City University()
2nd Author's Name Michihiro SHINTANI
2nd Author's Affiliation Faculty of Information Sciences, Hiroshima City University
3rd Author's Name Hideyuki ICHIHARA
3rd Author's Affiliation Faculty of Information Sciences, Hiroshima City University
4th Author's Name Tomoo INOUE
4th Author's Affiliation Faculty of Information Sciences, Hiroshima City University
5th Author's Name Akio TAMURA
5th Author's Affiliation Faculty of Information Sciences, Hiroshima City University
Date 2003/2/14
Paper # DC2002-90
Volume (vol) vol.102
Number (no) 658
Page pp.pp.-
#Pages 6
Date of Issue