Presentation | 2003/2/14 A Test Compression for Test Application Based on Huffman Coding Toshihiro OHARA, Michihiro SHINTANI, Hideyuki ICHIHARA, Tomoo INOUE, Akio TAMURA, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Test compression/decompression method using Huffman coding is an efficient method for reducing the test application cost, i. e., test application time and the size of the storage of a LSI tester. Previous works for the method, however, do not discuss the test application time adequately. In this paper, we clarify the fact that it depends on the compression ratio and the minimum length of cord words of an encoded test data, and then propose a new test compression method for reducing test application time based on Huffman coding. The proposed compression method can reduce test application time because it can optimize both of the compression ratio and the minimum length of the cord words. Experimental results show that the proposed method can reduce test application time appropriately. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Huffman code / test compression / test application / complete binary tree |
Paper # | DC2002-90 |
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Committee | DC |
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Conference Date | 2003/2/14(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Paper Information | |
Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | A Test Compression for Test Application Based on Huffman Coding |
Sub Title (in English) | |
Keyword(1) | Huffman code |
Keyword(2) | test compression |
Keyword(3) | test application |
Keyword(4) | complete binary tree |
1st Author's Name | Toshihiro OHARA |
1st Author's Affiliation | Faculty of Information Sciences, Hiroshima City University() |
2nd Author's Name | Michihiro SHINTANI |
2nd Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
3rd Author's Name | Hideyuki ICHIHARA |
3rd Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
4th Author's Name | Tomoo INOUE |
4th Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
5th Author's Name | Akio TAMURA |
5th Author's Affiliation | Faculty of Information Sciences, Hiroshima City University |
Date | 2003/2/14 |
Paper # | DC2002-90 |
Volume (vol) | vol.102 |
Number (no) | 658 |
Page | pp.pp.- |
#Pages | 6 |
Date of Issue |