| Presentation | 2003/2/14 Application of Partially Rotational Scan Technique to Tester IP Kenichi Ichino, Kohichi Watanabe, Yuki Yamagata, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | A Partially rotational scan (PRS) circuit is effective for the compaction of test data for n-detection test and the at-speed testing using low speed tester. In this work, we evaluate PRSs in tester IP applying to COMET II processor and Viper processor. When we test COMET II processor with LFSR, about 60% fault coverage is obtained. On the other hand, the PRS circuits can achieve high fault coverage such as obtained by ATPG. And using 15-detection test for COMET II processor with PRS, it requires 10% of 15-detection ATPG test data. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Hybrid BIST / n-Detection Test / Partially Rotational Scan |
| Paper # | DC2002-88 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2003/2/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
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| Vice Chair | |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Application of Partially Rotational Scan Technique to Tester IP |
| Sub Title (in English) | |
| Keyword(1) | Hybrid BIST |
| Keyword(2) | n-Detection Test |
| Keyword(3) | Partially Rotational Scan |
| 1st Author's Name | Kenichi Ichino |
| 1st Author's Affiliation | Department of Electrical Eng. Graduate School of Eng., Tokyo Metropolitan Univ.() |
| 2nd Author's Name | Kohichi Watanabe |
| 2nd Author's Affiliation | Department of Electrical Eng.Graduate School of Eng., Tokyo Metropolitan Univ. |
| 3rd Author's Name | Yuki Yamagata |
| 3rd Author's Affiliation | Department of Electrical Eng. Graduate School of Eng., Tokyo Metropolitan Univ. |
| 4th Author's Name | Masayuki Arai |
| 4th Author's Affiliation | Department of Electrical Eng. Graduate School of Eng., Tokyo Metropolitan Univ. |
| 5th Author's Name | Satoshi Fukumoto |
| 5th Author's Affiliation | Department of Electrical Eng. Graduate School of Eng., Tokyo Metropolitan Univ. |
| 6th Author's Name | Kazuhiko Iwasaki |
| 6th Author's Affiliation | Department of Electrical Eng. Graduate School of Eng., Tokyo Metropolitan Univ. |
| Date | 2003/2/14 |
| Paper # | DC2002-88 |
| Volume (vol) | vol.102 |
| Number (no) | 658 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |