| Presentation | 2003/2/14 MD-SCAN Method for Low Power Scan Testing Takaki Yoshida, Masafumi Watari, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | As semiconductor manufacturing technology advances, power dissipation and noise in scan testing have become critical problems. Our studies on practical LSI manufacturing show that power supply voltage drop causes testing problems during shift operations in scan testing. In this paper, we present a new testing method named MD-SCAN (Multi Duty-Scan) which solves power supply voltage drop problems, as well as its experimental results applied to practical LSI chips. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Power supply voltage drop / Noise / Low power / Scan test / Clock duty |
| Paper # | DC2002-87 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2003/2/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | MD-SCAN Method for Low Power Scan Testing |
| Sub Title (in English) | |
| Keyword(1) | Power supply voltage drop |
| Keyword(2) | Noise |
| Keyword(3) | Low power |
| Keyword(4) | Scan test |
| Keyword(5) | Clock duty |
| 1st Author's Name | Takaki Yoshida |
| 1st Author's Affiliation | Matshusita Electric Industrial Co., Ltd.() |
| 2nd Author's Name | Masafumi Watari |
| 2nd Author's Affiliation | Matshusita Electric Industrial Co., Ltd. |
| Date | 2003/2/14 |
| Paper # | DC2002-87 |
| Volume (vol) | vol.102 |
| Number (no) | 658 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |