| Presentation | 2003/2/14 Analysis Method of Analog Circuits by an Operation-Region Model Daisuke KATO, Yukiya MIURA, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | MOS transistors have three operation regions, cut-off, linear and saturation regions. An operation-region model is a modeling method, which is based on observation of change in operation regions of MOS transistors. We can analyze analog circuits, digital circuits and mixed-signal circuits by the operation-region model because it does not depend on structures of circuits. In this paper, we discuss analysis and testing of analog circuits by the operation-region model. First, we propose an analysis method of analog circuits by the operation-region model, and we apply it for analyzing ITC benchmark circuits. Next, we also propose a method for applying the operation-region model to testing. Finally, we propose and verify a more efficient method for analyzing analog circuits by the operation-region model. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Circuit Model / Analog Circuits / Analysis and Testing / CMOS Circuits / Operation Regions |
| Paper # | DC2002-81 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2003/2/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Analysis Method of Analog Circuits by an Operation-Region Model |
| Sub Title (in English) | |
| Keyword(1) | Circuit Model |
| Keyword(2) | Analog Circuits |
| Keyword(3) | Analysis and Testing |
| Keyword(4) | CMOS Circuits |
| Keyword(5) | Operation Regions |
| 1st Author's Name | Daisuke KATO |
| 1st Author's Affiliation | The Graduate School of Engineering, Tokyo Metropolitan University() |
| 2nd Author's Name | Yukiya MIURA |
| 2nd Author's Affiliation | The Graduate School of Engineering, Tokyo Metropolitan University |
| Date | 2003/2/14 |
| Paper # | DC2002-81 |
| Volume (vol) | vol.102 |
| Number (no) | 658 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |