| Presentation | 2003/2/14 Fault Diagnosis Based on Ambiguous Test Set Under BIST Hiroshi TAKAHASHI, Yasunori TUGAOKA, Hidekazu AYANO, Yuzo TAKAMATSU, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In this paper, we propose a method for diagnosing stuck-at faults under Built-in Self-Test (BIST) environment. Fault diagnosis under BIST environment is more difficult because only limited information for making the diagnostic test set is available in highly compacted signatures that are produced with BIST. Therefore the failing test set that is identified in BIST session includes accidentally non-failing tests. We call the test set that includes failing tests and non-failing tests an "ambiguous diagnostic test set". First, we propose a method for identifying candidate faults based on the ambiguous diagnostic test set. Moreover we propose a method for identifying the non-failing tests which are belonged to the ambiguous diagnostic test set. We propose an extended method for diagnosing multiple stuck-at faults. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | fault diagnosis / BIST |
| Paper # | DC2002-79 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2003/2/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Fault Diagnosis Based on Ambiguous Test Set Under BIST |
| Sub Title (in English) | |
| Keyword(1) | fault diagnosis |
| Keyword(2) | BIST |
| 1st Author's Name | Hiroshi TAKAHASHI |
| 1st Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University() |
| 2nd Author's Name | Yasunori TUGAOKA |
| 2nd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering, Ehime University |
| 3rd Author's Name | Hidekazu AYANO |
| 3rd Author's Affiliation | Dept. of Computer Science, Faculty of Engineering,Ehime University |
| 4th Author's Name | Yuzo TAKAMATSU |
| 4th Author's Affiliation | Dept. of computer Science, Faculty of Engineering, Ehime University |
| Date | 2003/2/14 |
| Paper # | DC2002-79 |
| Volume (vol) | vol.102 |
| Number (no) | 658 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |