Presentation | 2002/11/21 Fault Diagnosis for RAMs using Walsh Transform Atsumu ISENO, Yukihiro IGUCHI, Tsutomu SASAO, |
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Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In this paper, we show a method to locate single-stuck at fault for random access memory (RAM). From the fail-bitmaps of the memory, we obtain the Walsh transform of them. For single-stuck at faults, we show that the fault can be located by using only the 0-th and 1-st coefficients of the spectrum. The computation time is O(n×2^n), where n is the number of bits in the address. Thus, we can quickly locate the faults. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | memory test / Walsh transform / fault diagnosis / fail-bitmap / SRAM |
Paper # | DC2002-43 |
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Committee | DC |
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Conference Date | 2002/11/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fault Diagnosis for RAMs using Walsh Transform |
Sub Title (in English) | |
Keyword(1) | memory test |
Keyword(2) | Walsh transform |
Keyword(3) | fault diagnosis |
Keyword(4) | fail-bitmap |
Keyword(5) | SRAM |
1st Author's Name | Atsumu ISENO |
1st Author's Affiliation | Department of Computer Science, Meiji University() |
2nd Author's Name | Yukihiro IGUCHI |
2nd Author's Affiliation | Department of Computer Science, Meiji University |
3rd Author's Name | Tsutomu SASAO |
3rd Author's Affiliation | Department of Computer Science and Electronics, Kyushu Institute of Technology:Center for Microelectronic Systems, Kyushu Institute of Technology |
Date | 2002/11/21 |
Paper # | DC2002-43 |
Volume (vol) | vol.102 |
Number (no) | 479 |
Page | pp.pp.- |
#Pages | 6 |
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