| Presentation | 2002/11/21 A Seed Selection Procedure for Random Pattern Generators Based on LFSR Kenichi ICHINO, Ko-ichi WATANABE, Masayuki ARAI, Satoshi FUKUMOTO, Kazuhiko IWASAKI, |
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| PDF Download Page | PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We propose a technique of selecting seeds for the LFSR-based test pattern generators that are used in VLSI BIST. By setting the computed seed as an initial value, target fault coverage, for example 100%, can be accomplished with minimum test length. We can also maximize fault coverage for a given test length. Our method can be used for both test-per-clock and test-per-scan BISTs. The procedure is based on vector representation over GF(2^m), where m is the number of LFSR stages. The results show that the test lengths the selected seeds derive are about sixty percent shorter than those derived by conventionally selected seeds for a given fault coverage. We also show that the seeds obtained through this technique accomplish higher fault coverage than the conventional selection procedure. In term of the c7552 benchmark, taking a test-per-scan architecture with a 20-bit LFSR as an example, the number of undetected faults can be decreased from 304 to 227 for 10,000 LFSR patterns using our proposed technique. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | LFSR / BIST / PRPG / Seed |
| Paper # | DC2002-42 |
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| Conference Information | |
| Committee | DC |
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| Conference Date | 2002/11/21(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
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| Paper Information | |
| Registration To | Dependable Computing (DC) |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Seed Selection Procedure for Random Pattern Generators Based on LFSR |
| Sub Title (in English) | |
| Keyword(1) | LFSR |
| Keyword(2) | BIST |
| Keyword(3) | PRPG |
| Keyword(4) | Seed |
| 1st Author's Name | Kenichi ICHINO |
| 1st Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University() |
| 2nd Author's Name | Ko-ichi WATANABE |
| 2nd Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University |
| 3rd Author's Name | Masayuki ARAI |
| 3rd Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University |
| 4th Author's Name | Satoshi FUKUMOTO |
| 4th Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University |
| 5th Author's Name | Kazuhiko IWASAKI |
| 5th Author's Affiliation | Graduate School of Engineering, Tokyo Metropolitan University |
| Date | 2002/11/21 |
| Paper # | DC2002-42 |
| Volume (vol) | vol.102 |
| Number (no) | 479 |
| Page | pp.pp.- |
| #Pages | 6 |
| Date of Issue | |