Presentation | 2002/11/21 On Efficient Identification and Preservation of Indirect Implications in Static Learning Keitaro Saruwatari, Seiji Kajihara, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | In automatic test pattern generation based on the path sensitization method, it is useful for an implication procedure to utilize indirect implications derived by static learning. While it still has been required to speed-up ATPG for large circuits, there is a problem that there are too many indirect implications to store. In this paper we propose a new learning criterion to find indirect implications that cannot be found by the previous method. Also we consider a method of static learning to avoid preserving redundant indirect implications. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | static leaning / indirect implication / test pattern generation / combinational circuit |
Paper # | DC2002-38 |
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Committee | DC |
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Conference Date | 2002/11/21(1days) |
Place (in Japanese) | (See Japanese page) |
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Topics (in Japanese) | (See Japanese page) |
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Registration To | Dependable Computing (DC) |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | On Efficient Identification and Preservation of Indirect Implications in Static Learning |
Sub Title (in English) | |
Keyword(1) | static leaning |
Keyword(2) | indirect implication |
Keyword(3) | test pattern generation |
Keyword(4) | combinational circuit |
1st Author's Name | Keitaro Saruwatari |
1st Author's Affiliation | Department of Computer Sciences and Electronics, Kyushu Institute of Technology() |
2nd Author's Name | Seiji Kajihara |
2nd Author's Affiliation | Department of Computer Sciences and Electronics, Kyushu Institute of Technology:Center for Microelectronics Systems, Kyushu Institute of Technology |
Date | 2002/11/21 |
Paper # | DC2002-38 |
Volume (vol) | vol.102 |
Number (no) | 479 |
Page | pp.pp.- |
#Pages | 4 |
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