Presentation 2002/11/21
On Efficient Identification and Preservation of Indirect Implications in Static Learning
Keitaro Saruwatari, Seiji Kajihara,
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Abstract(in English) In automatic test pattern generation based on the path sensitization method, it is useful for an implication procedure to utilize indirect implications derived by static learning. While it still has been required to speed-up ATPG for large circuits, there is a problem that there are too many indirect implications to store. In this paper we propose a new learning criterion to find indirect implications that cannot be found by the previous method. Also we consider a method of static learning to avoid preserving redundant indirect implications.
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Keyword(in English) static leaning / indirect implication / test pattern generation / combinational circuit
Paper # DC2002-38
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Committee DC
Conference Date 2002/11/21(1days)
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Registration To Dependable Computing (DC)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) On Efficient Identification and Preservation of Indirect Implications in Static Learning
Sub Title (in English)
Keyword(1) static leaning
Keyword(2) indirect implication
Keyword(3) test pattern generation
Keyword(4) combinational circuit
1st Author's Name Keitaro Saruwatari
1st Author's Affiliation Department of Computer Sciences and Electronics, Kyushu Institute of Technology()
2nd Author's Name Seiji Kajihara
2nd Author's Affiliation Department of Computer Sciences and Electronics, Kyushu Institute of Technology:Center for Microelectronics Systems, Kyushu Institute of Technology
Date 2002/11/21
Paper # DC2002-38
Volume (vol) vol.102
Number (no) 479
Page pp.pp.-
#Pages 4
Date of Issue