Presentation 2002/11/21
Design for Consecutive Transparency of RTL Circuits
Tomokazu YONEDA, Hideo FUJIWARA,
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Abstract(in English) This paper presents a design-for-consecutive-transparency method that makes a core(RTL circuit) consecutively transparent using integer linear programming. Consecutive transparency of a core guarantees consecutive propagation of arbitrary test/response sequences from the core inputs to the core outputs with some latency. Therefore, it is possible to apply/observe arbitrary test/response sequences to/from an embedded core consecutively at the speed of system clock by using interconnects and consecutively transparent cores in an SoC. Experimental results show that the proposed method introduces lower area overhead compared to the bypass method that adds direct paths from PIs to POs with multiplexers.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Design for Testability / Systems-on-a-Chip / Test Access Mechanism / Consecutive Transparency / Consecutive Testability / Register Transfer Level
Paper # DC2002-37
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Conference Date 2002/11/21(1days)
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Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Design for Consecutive Transparency of RTL Circuits
Sub Title (in English)
Keyword(1) Design for Testability
Keyword(2) Systems-on-a-Chip
Keyword(3) Test Access Mechanism
Keyword(4) Consecutive Transparency
Keyword(5) Consecutive Testability
Keyword(6) Register Transfer Level
1st Author's Name Tomokazu YONEDA
1st Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology()
2nd Author's Name Hideo FUJIWARA
2nd Author's Affiliation Graduate School of Information Science, Nara Institute of Science and Technology
Date 2002/11/21
Paper # DC2002-37
Volume (vol) vol.102
Number (no) 479
Page pp.pp.-
#Pages 6
Date of Issue