Presentation 2004/8/17
Difference between hazardous event rates obtained by two stochastic models
Itaru YOSHIMURA, Yoshinobu SATO, Koichi SUYAMA,
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Abstract(in English) Recently computer systems are widely applied to various fields for implementation of safety functions. This general trend forced IEC to compile IEC 61508 as a standard related to functional safety of electrical/electronic/programmable electronic safety-related system, I.e. E/E/PE SRS (hereinafter SRS). Lately Japanese Industrial Standard included the translated standard JIS C 0508. The standard requires assessing the risk reduction achieved by SRS using appropriate probabilistic techniques for allocation of safety integrity levels (SILs) to SRS. However, the relationships among SILs, operation modes and hazardous event rate have not been always cleared up yet. Then, two formulas are presented using a Markovian model and sequential failure logics in order to describe causation of hazardous events in the overall system and to estimate hazardous event rate in the dynamic demand state of SRS. The present paper compares those two models and verifies their applicability to generic overall systems. Namely, the difference between two formulas is much less than the values which is able to change the SILs for SRS on actual time between proof tests and longer ones. Thus, it is concluded that both of the precise estimation by the Markovian model and approximate estimation by the sequential failure logics are useful for the estimation of hazardous event rates of generic overall systems.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Functional Safety / Safety Integrity Level / Hazardous Event Rate / Markovian Model / Sequential Failure Logic
Paper # SSS2004-17
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Conference Information
Committee SSS
Conference Date 2004/8/17(1days)
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Registration To Safety (SSS)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Difference between hazardous event rates obtained by two stochastic models
Sub Title (in English)
Keyword(1) Functional Safety
Keyword(2) Safety Integrity Level
Keyword(3) Hazardous Event Rate
Keyword(4) Markovian Model
Keyword(5) Sequential Failure Logic
1st Author's Name Itaru YOSHIMURA
1st Author's Affiliation Tokyo University of Marine Science and Technology()
2nd Author's Name Yoshinobu SATO
2nd Author's Affiliation Tokyo University of Marine Science and Technology
3rd Author's Name Koichi SUYAMA
3rd Author's Affiliation Tokyo University of Marine Science and Technology
Date 2004/8/17
Paper # SSS2004-17
Volume (vol) vol.104
Number (no) 256
Page pp.pp.-
#Pages 5
Date of Issue