Presentation 2004/1/23
Temperature and Thickness Sensor using Optical Fiber-type Low-coherence Interferometer
Kanta KAWASAKI, Keigo TAKEDA, Masafumi ITO, Chishio KOSHIMIZU,
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Abstract(in English) The temperature control of substrates will be significant to realize much finer and deeper pattern in an ultra-fine processing technology such as a plasma process. However a promising sensor system has not been developed. So we have developed a temperature sensor for measuring the temperature of each layer of multi-layered substrates, such as silicon on insulator (SOI) used in micro-machining processes, using a low-coherence interferometer and a Michelson interferometer. We have evaluated the system using three layered substrates. From these results, we have confirmed the usefulness of the system. But, circumstantially, the system cannot measure the temperatures of substrates with thin film layers which have the optical pass length less than coherent length of a low-coherent light source. To overcome this problem, we have proposed a novel sensor for measuring the thickness of the thin film layer as well as the temperature of the substrate.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) plasma etching / low-coherence interferometer / Michelson interferometer / optical fiber sensor
Paper # PN2003-81,OFT2003-104,OPE2003-261,LQE2003-198
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Conference Information
Committee OFT
Conference Date 2004/1/23(1days)
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Registration To Optical Fiber Technology (OFT)
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Temperature and Thickness Sensor using Optical Fiber-type Low-coherence Interferometer
Sub Title (in English)
Keyword(1) plasma etching
Keyword(2) low-coherence interferometer
Keyword(3) Michelson interferometer
Keyword(4) optical fiber sensor
1st Author's Name Kanta KAWASAKI
1st Author's Affiliation Graduate School of Systems Engineering, Wakayama University()
2nd Author's Name Keigo TAKEDA
2nd Author's Affiliation Graduate School of Systems Engineering, Wakayama University
3rd Author's Name Masafumi ITO
3rd Author's Affiliation Graduate School of Systems Engineering, Wakayama University
4th Author's Name Chishio KOSHIMIZU
4th Author's Affiliation ESD Development Division, Tokyo Electron AT Ltd.
Date 2004/1/23
Paper # PN2003-81,OFT2003-104,OPE2003-261,LQE2003-198
Volume (vol) vol.103
Number (no) 615
Page pp.pp.-
#Pages 6
Date of Issue