| Presentation | 2018-12-17 [Invited Talk] Evaluation of semiconductor materials and devices by terahertz emission spectroscopy and imaging Iwao Kawayama, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | ED2018-56 |
| Date of Issue | 2018-12-10 (ED) |
| Conference Information | |
| Committee | ED |
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| Conference Date | 2018/12/17(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | RIEC, Tohoku Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Millimeter-wave, terahertz-wave devices and systems |
| Chair | Kunio Tsuda(Toshiba) |
| Vice Chair | Michihiko Suhara(TMU) |
| Secretary | Michihiko Suhara(NICT) |
| Assistant | Tatsuya Iwata(TUT) / Junji Kotani(Fjitsu Lab.) |
| Paper Information | |
| Registration To | Technical Committee on Electron Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Talk] Evaluation of semiconductor materials and devices by terahertz emission spectroscopy and imaging |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Iwao Kawayama |
| 1st Author's Affiliation | Osaka University(Osaka Univ.) |
| Date | 2018-12-17 |
| Paper # | ED2018-56 |
| Volume (vol) | vol.118 |
| Number (no) | ED-368 |
| Page | pp.pp.11-14(ED), |
| #Pages | 4 |
| Date of Issue | 2018-12-10 (ED) |