| Presentation | 2018-12-14 On-Chip Delay Measurement for In-field Periodic Test of FPGAs Yousuke Miyake, Yasuo Sato, Seiji Kajihara, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Delay-related failures due to aging phenomena are a critical issue of state-of-the-art VLSI systems. In order to detect a delay increase by aging, repeated delay measurement in field is effective. A delay measurement method based on BIST (Built-In Self-Test) with variable test timing generation has been proposed for FPGAs. However, the measured delay in field is influenced of environment factors such as temperature variation. Thus, a correction of temperature influence for the measured delay is required for highly accurate delay measurement. This paper proposes a correction method of temperature influence for a measured delay. The proposed method consists of delay measurement with variable test timing generation and correction of temperature influence with an embedded temperature sensor. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | FPGA / Logic BIST / Delay measurement / Temperature sensor / Field test |
| Paper # | DC2018-58 |
| Date of Issue | 2018-12-07 (DC) |
| Conference Information | |
| Committee | DC |
|---|---|
| Conference Date | 2018/12/14(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Miyako Seisyonen-No-Ie |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | 3rd Winter Workshop on safety |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) |
| Secretary | Hiroshi Takahashi(Tokyo Inst. of Tech.) |
| Assistant | |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On-Chip Delay Measurement for In-field Periodic Test of FPGAs |
| Sub Title (in English) | |
| Keyword(1) | FPGA |
| Keyword(2) | Logic BIST |
| Keyword(3) | Delay measurement |
| Keyword(4) | Temperature sensor |
| Keyword(5) | Field test |
| 1st Author's Name | Yousuke Miyake |
| 1st Author's Affiliation | Kyushu Institute of Technology(KIT) |
| 2nd Author's Name | Yasuo Sato |
| 2nd Author's Affiliation | Kyushu Institute of Technology(KIT) |
| 3rd Author's Name | Seiji Kajihara |
| 3rd Author's Affiliation | Kyushu Institute of Technology(KIT) |
| Date | 2018-12-14 |
| Paper # | DC2018-58 |
| Volume (vol) | vol.118 |
| Number (no) | DC-364 |
| Page | pp.pp.1-6(DC), |
| #Pages | 6 |
| Date of Issue | 2018-12-07 (DC) |