Presentation 2018-11-09
Fundamental Study on the Effect of Torque Value at Connector on Equivalent Circuit of Contact Boundary
Daisuke Fujimoto, Takashi Narimatsu, Yu-ichi Hayashi,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In a situation where the torque management is insufficient, contact failure could occur in the connector as the interconnection portion. Contact failure locally reduces the immunity and degrades the electromagnetic environment around the equipment. It has been shown in previous reports that parasitic inductance increases due to contact failure of connectors and increases radiated electromagnetic noise. However, there is not enough discussion about the effect of the change in the torque value of the connector on the surrounding electromagnetic environment. In this paper, when the torque value of the connector is changed, the circuit response and the near field at the contact boundary are measured. Based on these results, we discuss the influence of the change in torque value on the electromagnetic environment around the connector.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Contact failure of connectorEMITDR
Paper # EMD2018-47
Date of Issue 2018-11-02 (EMD)

Conference Information
Committee EMD
Conference Date 2018/11/9(1days)
Place (in Japanese) (See Japanese page)
Place (in English) The University of Electro-Communications
Topics (in Japanese) (See Japanese page)
Topics (in English) International Session IS-EMD2018
Chair Shinichi Wada(TMC System)
Vice Chair Yoshiki Kayano(Univ. of Electro-Comm.)
Secretary Yoshiki Kayano(Muroran Inst. of Tech.)
Assistant Yuichi Hayashi(NAIST)

Paper Information
Registration To Technical Committee on Electromechanical Devices
Language ENG
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fundamental Study on the Effect of Torque Value at Connector on Equivalent Circuit of Contact Boundary
Sub Title (in English)
Keyword(1) Contact failure of connectorEMITDR
1st Author's Name Daisuke Fujimoto
1st Author's Affiliation Nara Institute of Science and Technology(NAIST)
2nd Author's Name Takashi Narimatsu
2nd Author's Affiliation Nara Institute of Science and Technology(NAIST)
3rd Author's Name Yu-ichi Hayashi
3rd Author's Affiliation Nara Institute of Science and Technology(NAIST)
Date 2018-11-09
Paper # EMD2018-47
Volume (vol) vol.118
Number (no) EMD-290
Page pp.pp.37-41(EMD),
#Pages 5
Date of Issue 2018-11-02 (EMD)