Presentation 2018-10-29
Study on Signal-to-Noise Ratio Simulation of Side-Channel Traces Leaked from AES Circuit using EDA tool
Toshiaki Teshima, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # HWS2018-47,ICD2018-39
Date of Issue 2018-10-22 (HWS, ICD)

Conference Information
Committee HWS / ICD
Conference Date 2018/10/29(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kobe Univ. Umeda Intelligent Laboratory
Topics (in Japanese) (See Japanese page)
Topics (in English) HardwareSecurity, etc.
Chair Tsutomu Matsumoto(Yokohama National Univ.) / Hideto Hidaka(Renesas)
Vice Chair Shinichi Kawamura(Toshiba) / Makoto Ikeda(Univ. of Tokyo) / Makoto Nagata(Kobe Univ.)
Secretary Shinichi Kawamura(Kobe Univ.) / Makoto Ikeda(SECOM) / Makoto Nagata(Panasonic)
Assistant / Hiroyuki Ito(Tokyo Inst. of Tech.) / Masatoshi Tsuge(Socionext) / Tetsuya Hirose(Kobe Univ.)

Paper Information
Registration To Technical Committee on Hardware Security / Technical Committee on Integrated Circuits and Devices
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Study on Signal-to-Noise Ratio Simulation of Side-Channel Traces Leaked from AES Circuit using EDA tool
Sub Title (in English)
Keyword(1)
1st Author's Name Toshiaki Teshima
1st Author's Affiliation Okayama University(Okayama Univ.)
2nd Author's Name Yusuke Yano
2nd Author's Affiliation Okayama University(Okayama Univ.)
3rd Author's Name Kengo Iokibe
3rd Author's Affiliation Okayama University(Okayama Univ.)
4th Author's Name Yoshitaka Toyota
4th Author's Affiliation Okayama University(Okayama Univ.)
Date 2018-10-29
Paper # HWS2018-47,ICD2018-39
Volume (vol) vol.118
Number (no) HWS-272,ICD-273
Page pp.pp.1-5(HWS), pp.1-5(ICD),
#Pages 5
Date of Issue 2018-10-22 (HWS, ICD)