| Presentation | 2018-10-04 Multi-stage Error Collection Adaptive for Reliability in NAND Flash Memory Ryo Ogura, Masato Kitakami, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | NAND Flash memories / error correcting codes / P/E cycle / Multi-Stage BCH |
| Paper # | SS2018-19,DC2018-20 |
| Date of Issue | 2018-09-27 (SS, DC) |
| Conference Information | |
| Committee | DC / SS |
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| Conference Date | 2018/10/4(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Inuyama City Kokusai-Kanko Center Freud |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Software System etc |
| Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) / Akio Nakata(Hiroshima City Univ.) |
| Vice Chair | Hiroshi Takahashi(Ehime Univ.) / Takashi Kobayashi(Tokyo Inst. of Tech.) |
| Secretary | Hiroshi Takahashi(Tokyo Inst. of Tech.) / Takashi Kobayashi(Nihon Univ.) |
| Assistant | / Shinpei Hayashi(Tokyo Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing / Technical Committee on Software Science |
|---|---|
| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Multi-stage Error Collection Adaptive for Reliability in NAND Flash Memory |
| Sub Title (in English) | |
| Keyword(1) | NAND Flash memories |
| Keyword(2) | error correcting codes |
| Keyword(3) | P/E cycle |
| Keyword(4) | Multi-Stage BCH |
| 1st Author's Name | Ryo Ogura |
| 1st Author's Affiliation | Chiba University(Chiba Univ.) |
| 2nd Author's Name | Masato Kitakami |
| 2nd Author's Affiliation | Chiba University(Chiba Univ.) |
| Date | 2018-10-04 |
| Paper # | SS2018-19,DC2018-20 |
| Volume (vol) | vol.118 |
| Number (no) | SS-230,DC-231 |
| Page | pp.pp.7-12(SS), pp.7-12(DC), |
| #Pages | 6 |
| Date of Issue | 2018-09-27 (SS, DC) |