| Presentation | 2018-08-23 [Invited Talk] Highly reliable memory system realizing long-term preservation of digital data Toshio Kobayashi, |
|---|---|
| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Digital technology based on semiconductor technology has become indispensable technology for personal living and social activities by its overwhelming convenience and ability. On the other hand, it is known that in order to long-term preservation of digital data is a necessary ongoing financial strategy and the will to persist. If one of them is lost, there is impossible to preserve an information in the future, unlike paper media. Information that does not produce value in the short term, contents, even those that will become important to humanity in the future will be lost. Such a situation is called as the digital dark ages. As a first step to get the solution of this problem, researches on "Highly reliable long-term semiconductor memory system" are underway. There are many issues, however there is a potentially very huge business of the storage for long-term preservation. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Long-term preservation / Semiconductor / Non-volatile memory / Wiring / Emulation / Migration |
| Paper # | R2018-23,EMD2018-26,CPM2018-26,OPE2018-53,LQE2018-42 |
| Date of Issue | 2018-08-16 (R, EMD, CPM, OPE, LQE) |
| Conference Information | |
| Committee | EMD / LQE / OPE / CPM / R |
|---|---|
| Conference Date | 2018/8/23(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Otaru Camber of Commerce & Industry |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Shinichi Wada(TMC System) / Kiichi Hamamoto(Kyusyu Univ.) / Kouki Sato(Furukawa Electric Industries) / Fumihiko Hirose(Yamagata Univ.) / Tetsushi Yuge(National Defense Academy) |
| Vice Chair | Yoshiki Kayano(Univ. of Electro-Comm.) / Hiroshi Aruga(Mitsubishi Electric) / Hiroshi Takahashi(Sophia Univ.) / Mayumi Takeyama(Kitami Inst. of Tech.) / Akira Asato(Fujitsu) |
| Secretary | Yoshiki Kayano(Muroran Inst. of Tech.) / Hiroshi Aruga(Fuji Electric) / Hiroshi Takahashi(SEI) / Mayumi Takeyama(Furukawa Electric Industries) / Akira Asato(Univ. of Tokyo) |
| Assistant | Yuichi Hayashi(ＮＡＩＳＴ) / Masaya Nagai(Osaka Univ.) / Yuya Shoji(Tokyo Inst. of Tech.) / Kazunori Seno(NTT) / Yasuo Kimura(Tokyo Univ. of Tech.) / Hideki Nakazawa(Hirosaki Univ.) / Tomoaki Terasako(Ehime Univ.) / Shinji Inoue(Kansai Univ.) / Hiroyuki Okamura(Hiroshima Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Electromechanical Devices / Technical Committee on Lasers and Quantum Electronics / Technical Committee on OptoElectronics / Technical Committee on Component Parts and Materials / Technical Committee on Reliability |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Talk] Highly reliable memory system realizing long-term preservation of digital data |
| Sub Title (in English) | The background, issues and the prospects |
| Keyword(1) | Long-term preservation |
| Keyword(2) | Semiconductor |
| Keyword(3) | Non-volatile memory |
| Keyword(4) | Wiring |
| Keyword(5) | Emulation |
| Keyword(6) | Migration |
| 1st Author's Name | Toshio Kobayashi |
| 1st Author's Affiliation | Shibaura Institute of Technology(SIT) |
| Date | 2018-08-23 |
| Paper # | R2018-23,EMD2018-26,CPM2018-26,OPE2018-53,LQE2018-42 |
| Volume (vol) | vol.118 |
| Number (no) | R-185,EMD-186,CPM-187,OPE-188,LQE-189 |
| Page | pp.pp.31-36(R), pp.31-36(EMD), pp.31-36(CPM), pp.31-36(OPE), pp.31-36(LQE), |
| #Pages | 6 |
| Date of Issue | 2018-08-16 (R, EMD, CPM, OPE, LQE) |