| Presentation | 2018-08-09 [Invited Talk] Cu Atom Switch Technology toward 28nm Nonvolatile Programmable Logic Ryusuke Nebashi, Naoki Banno, Makoto Miyamura, Ayuka Morioka, Bai Xu, Koichiro Okamoto, Noriyuki Iguchi, Hideaki Numata, Hiromitsu Hada, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | |
| Paper # | SDM2018-51,ICD2018-38 |
| Date of Issue | 2018-07-31 (SDM, ICD) |
| Conference Information | |
| Committee | SDM / ICD / ITE-IST |
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| Conference Date | 2018/8/7(3days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Hokkaido Univ., Graduate School of IST M Bldg., M151 |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications |
| Chair | Takahiro Shinada(Tohoku Univ.) / Hideto Hidaka(Renesas) / Takayuki Hamamoto(Tokyo University of Science) |
| Vice Chair | Hiroshige Hirano(TowerJazz Panasonic) / Makoto Nagata(Kobe Univ.) / Hiroshi Ohtake(NHK) / Junichi Akita(Kanazawa Univ.) |
| Secretary | Hiroshige Hirano(Shizuoka Univ.) / Makoto Nagata(TOSHIBA MEMORY) / Hiroshi Ohtake(Panasonic) / Junichi Akita(Tohoku Univ.) |
| Assistant | Takahiro Mori(AIST) / Nobuaki Kobayashi(Nihon Univ.) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Masatoshi Tsuge(Socionext) / Tetsuya Hirose(Kobe Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Silicon Device and Materials / Technical Committee on Integrated Circuits and Devices / Technical Group on Information Sensing Technologies |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Invited Talk] Cu Atom Switch Technology toward 28nm Nonvolatile Programmable Logic |
| Sub Title (in English) | |
| Keyword(1) | |
| 1st Author's Name | Ryusuke Nebashi |
| 1st Author's Affiliation | NEC Corporation(NEC) |
| 2nd Author's Name | Naoki Banno |
| 2nd Author's Affiliation | NEC Corporation(NEC) |
| 3rd Author's Name | Makoto Miyamura |
| 3rd Author's Affiliation | NEC Corporation(NEC) |
| 4th Author's Name | Ayuka Morioka |
| 4th Author's Affiliation | NEC Corporation(NEC) |
| 5th Author's Name | Bai Xu |
| 5th Author's Affiliation | NEC Corporation(NEC) |
| 6th Author's Name | Koichiro Okamoto |
| 6th Author's Affiliation | NEC Corporation(NEC) |
| 7th Author's Name | Noriyuki Iguchi |
| 7th Author's Affiliation | NEC Corporation(NEC) |
| 8th Author's Name | Hideaki Numata |
| 8th Author's Affiliation | NEC Corporation(NEC) |
| 9th Author's Name | Hiromitsu Hada |
| 9th Author's Affiliation | NEC Corporation(NEC) |
| 10th Author's Name | Tadahiko Sugibayashi |
| 10th Author's Affiliation | NEC Corporation(NEC) |
| 11th Author's Name | Toshitsugu Sakamoto |
| 11th Author's Affiliation | NEC Corporation(NEC) |
| 12th Author's Name | Munehiro Tada |
| 12th Author's Affiliation | NEC Corporation(NEC) |
| Date | 2018-08-09 |
| Paper # | SDM2018-51,ICD2018-38 |
| Volume (vol) | vol.118 |
| Number (no) | SDM-172,ICD-173 |
| Page | pp.pp.131-135(SDM), pp.131-135(ICD), |
| #Pages | 5 |
| Date of Issue | 2018-07-31 (SDM, ICD) |