Presentation 2018-07-26
[Special Talk] Measurement method of disturbance below 30 MHz
Takashi Shinozuka,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) In these days, electrical and electronic devices using switching power supplies with switching frequencies from 10 kHz to 30 MHz are increasing significantly, so there is increasing concern about interference by disturbance below 30 MHz or less. Therefore Studies of conduced disturbance measurement for mains line and for communication line, also radiated disturbance measurement below 30 MHz or less are increasingly important. Based on the above background, this paper reports the results of the research on the measurement method of disturbances below 30 MHz or less.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) EMC measurement / Conducted disturbance / Radiated disturbance / AMN / AAN / LAS
Paper # EMCJ2018-21,EMD2018-19
Date of Issue 2018-07-19 (EMCJ, EMD)

Conference Information
Committee EMCJ / IEE-SPC / EMD
Conference Date 2018/7/26(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Osami Wada(Kyoto Univ.) / 船渡 寛人(宇都宮大学) / Shinichi Wada(TMC System)
Vice Chair Kensei Oh(Nagoya Inst. of Tech.) / 藤井 幹介(富士電機) / Yoshiki Kayano(Univ. of Electro-Comm.)
Secretary Kensei Oh(Tokyo Inst. of Tech.) / 藤井 幹介(Mitsubishi Electric) / Yoshiki Kayano(長岡技術科学大学)
Assistant Shinobu Nagasawa(Mitsubishi Electric) / Shinichiro Yamamoto(Univ. of Hyogo) / Takanori Unou(Denso) / 図子 祐輔(日産自動車) / 高見 弘(芝浦工業大学) / Yuichi Hayashi(Tohoku Gakuin Univ.)

Paper Information
Registration To Technical Committee on Electromagnetic Compatibility / Technical Meeting on Semiconductor Power Converter / Technical Committee on Electromechanical Devices
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) [Special Talk] Measurement method of disturbance below 30 MHz
Sub Title (in English)
Keyword(1) EMC measurement
Keyword(2) Conducted disturbance
Keyword(3) Radiated disturbance
Keyword(4) AMN
Keyword(5) AAN
Keyword(6) LAS
1st Author's Name Takashi Shinozuka
1st Author's Affiliation National Institute of Information and Communications Technology(NICT)
Date 2018-07-26
Paper # EMCJ2018-21,EMD2018-19
Volume (vol) vol.118
Number (no) EMCJ-158,EMD-159
Page pp.pp.29-34(EMCJ), pp.29-34(EMD),
#Pages 6
Date of Issue 2018-07-19 (EMCJ, EMD)