| Presentation | 2018-07-26 On Determining the Fitting Range to Calibrate the SAR Probe Using the Waveguide System Nozomu Ishii, Yuto Shimizu, Tomoaki Nagaoka, Soichi Watanabe, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | In the measurement of the specific absorption rate (SAR) of the wireless mobile device, the electric field probe is scanned in the phantom liquid and the SAR distribution produced in the phantom liquid is measured. It is necessary to calibrate the probe or to relate the electric field intensity at the tip of the probe to the combined output voltage of the probe. In frequency bands used in mobile phones, the calibration of the probe is generally carried out in a waveguide well filled with phantom liquid. In this report, we propose a method of determining appropriate ranges to fit the combined output voltage to the corresponding exponential decay function. We also discuss how to compensate the boundary effect superimposed on the combined output voltage near the bottom of the waveguide well. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Specific absorption rate / Phantom liquid / Electric-field probe / Waveguide / Fitting range / Boundary effect |
| Paper # | EMCJ2018-19,EMD2018-17 |
| Date of Issue | 2018-07-19 (EMCJ, EMD) |
| Conference Information | |
| Committee | EMCJ / IEE-SPC / EMD |
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| Conference Date | 2018/7/26(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Osami Wada(Kyoto Univ.) / 船渡 寛人(宇都宮大学) / Shinichi Wada(TMC System) |
| Vice Chair | Kensei Oh(Nagoya Inst. of Tech.) / 藤井 幹介(富士電機) / Yoshiki Kayano(Univ. of Electro-Comm.) |
| Secretary | Kensei Oh(Tokyo Inst. of Tech.) / 藤井 幹介(Mitsubishi Electric) / Yoshiki Kayano(長岡技術科学大学) |
| Assistant | Shinobu Nagasawa(Mitsubishi Electric) / Shinichiro Yamamoto(Univ. of Hyogo) / Takanori Unou(Denso) / 図子 祐輔(日産自動車) / 高見 弘(芝浦工業大学) / Yuichi Hayashi(Tohoku Gakuin Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility / Technical Meeting on Semiconductor Power Converter / Technical Committee on Electromechanical Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | On Determining the Fitting Range to Calibrate the SAR Probe Using the Waveguide System |
| Sub Title (in English) | |
| Keyword(1) | Specific absorption rate |
| Keyword(2) | Phantom liquid |
| Keyword(3) | Electric-field probe |
| Keyword(4) | Waveguide |
| Keyword(5) | Fitting range |
| Keyword(6) | Boundary effect |
| 1st Author's Name | Nozomu Ishii |
| 1st Author's Affiliation | National Institute of Information and Communications Technology/Niigata University(NICT/Niigata Univ.) |
| 2nd Author's Name | Yuto Shimizu |
| 2nd Author's Affiliation | National Institute of Information and Communications Technology(NICT) |
| 3rd Author's Name | Tomoaki Nagaoka |
| 3rd Author's Affiliation | National Institute of Information and Communications Technology(NICT) |
| 4th Author's Name | Soichi Watanabe |
| 4th Author's Affiliation | National Institute of Information and Communications Technology(NICT) |
| Date | 2018-07-26 |
| Paper # | EMCJ2018-19,EMD2018-17 |
| Volume (vol) | vol.118 |
| Number (no) | EMCJ-158,EMD-159 |
| Page | pp.pp.19-24(EMCJ), pp.19-24(EMD), |
| #Pages | 6 |
| Date of Issue | 2018-07-19 (EMCJ, EMD) |