Presentation | 2018-07-25 Fundamental Study on Identification of EM Leakage Source of Audio Information from a Smart Device Izumi Nishina, Daisuke Fujimoto, Masahiro Kinugawa, Yu-ichi Hayashi, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | A threat of leakage of sound information via electromagnetic field from a smart device having an audio output function has been reported. To suppress leakage of sound information through EM waves, it is useful to search frequency bands that propagate sound information and electrical components that cause leakage of audio information. However, there is not enough discussion about the electrical components causing information leakage. In this paper, to provide the fundamental knowledge necessary to suppress leakage, we measure the EM field including audio information radiated from the components of the device and create cartography relating to the intensity of the radiated EM field. Thereby, we are able to find out the part causing information leakage. Finally, we verify the leakage source by extracting component and measuring EM waves from the component. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | EM information leakage / Smart device / Sound information leakage / EM radiated signal measurement / Cartography |
Paper # | ISEC2018-21,SITE2018-13,HWS2018-18,ICSS2018-24,EMM2018-20 |
Date of Issue | 2018-07-18 (ISEC, SITE, HWS, ICSS, EMM) |
Conference Information | |
Committee | HWS / ISEC / SITE / ICSS / EMM / IPSJ-CSEC / IPSJ-SPT |
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Conference Date | 2018/7/25(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Sapporo Convention Center |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Security, etc. |
Chair | Tsutomu Matsumoto(Yokohama National Univ.) / Atsushi Fujioka(Kanagawa Univ.) / Tetsuya Morizumi(Kanagawa Univ.) / Yoshiaki Shiraishi(Kobe Univ.) / Keiichi Iwamura(TUC) |
Vice Chair | Shinichi Kawamura(Toshiba) / Makoto Ikeda(Univ. of Tokyo) / Shiho Moriai(NICT) / Shoichi Hirose(Univ. of Fukui) / Masaru Ogawa(Kobe Gakuin Univ.) / Takushi Otani(Kibi International Univ.) / Hiroki Takakura(NII) / Katsunari Yoshioka(Yokohama National Univ.) / Minoru Kuribayashi(Okayama Univ.) / Tetsuya Kojima(NIT,Tokyo College) |
Secretary | Shinichi Kawamura(Kobe Univ.) / Makoto Ikeda(SECOM) / Shiho Moriai(Tokai Univ.) / Shoichi Hirose(NICT) / Masaru Ogawa(Tokyo Univ. of the Arts) / Takushi Otani(Toyo Eiwa Univ.) / Hiroki Takakura(NTT) / Katsunari Yoshioka(NICT) / Minoru Kuribayashi(NIT, Tokyo) / Tetsuya Kojima(Tyukyo Univ.) |
Assistant | / Kazunari Omote(Tsukuba Univ.) / Yuuji Suga(IIJ) / Hisanori Kato(KDDI Research) / Nobuyuki Yoshinaga(Yamaguchi Pref Univ.) / Daisuke Suzuki(Hokuriku Univ.) / Akira Yamada(KDDI labs.) / Keisuke Kito(Mitsubishi Electric) / Hiroko Akiyama(National Institute of Technology, Nagano College) / キタヒロ カネダ(CANON) |
Paper Information | |
Registration To | Technical Committee on Hardware Security / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Enriched MultiMedia / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Fundamental Study on Identification of EM Leakage Source of Audio Information from a Smart Device |
Sub Title (in English) | |
Keyword(1) | EM information leakage |
Keyword(2) | Smart device |
Keyword(3) | Sound information leakage |
Keyword(4) | EM radiated signal measurement |
Keyword(5) | Cartography |
1st Author's Name | Izumi Nishina |
1st Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
2nd Author's Name | Daisuke Fujimoto |
2nd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
3rd Author's Name | Masahiro Kinugawa |
3rd Author's Affiliation | National Institute of Technology, Sendai College(NIT) |
4th Author's Name | Yu-ichi Hayashi |
4th Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
Date | 2018-07-25 |
Paper # | ISEC2018-21,SITE2018-13,HWS2018-18,ICSS2018-24,EMM2018-20 |
Volume (vol) | vol.118 |
Number (no) | ISEC-151,SITE-152,HWS-153,ICSS-154,EMM-155 |
Page | pp.pp.83-88(ISEC), pp.83-88(SITE), pp.83-88(HWS), pp.83-88(ICSS), pp.83-88(EMM), |
#Pages | 6 |
Date of Issue | 2018-07-18 (ISEC, SITE, HWS, ICSS, EMM) |