Presentation | 2018-07-25 Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi, Naofumi Homma, Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | Fault injection attacks using intentional electromagnetic interference against cryptographic devices have been reported. When evaluating whether a device is a target of such a threat, traditionally, a method of directly tracing an attack meth-od has been used. For that reason, evaluation takes about the same time as the attack. In this paper, we propose a method to shorten the evaluation time using Gaussian noise. To evaluate whether the device is the subject of the threat de-scribed above, it is necessary to investigate whether there are frequencies causing a setup time violation in the crypto-graphic module from the outside the device. To find effective frequencies causing faults, conventionally, a wide fre-quency range was searched for sufficient time while changing the frequency step. On the other hand, in this paper, we inject Gaussian noise with broadband frequency components to the target equipment to eliminate frequency search and evaluate whether it is a threat target in a short time. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | Intentional Electromagnetic Interference / Fault Injection Attack |
Paper # | ISEC2018-20,SITE2018-12,HWS2018-17,ICSS2018-23,EMM2018-19 |
Date of Issue | 2018-07-18 (ISEC, SITE, HWS, ICSS, EMM) |
Conference Information | |
Committee | HWS / ISEC / SITE / ICSS / EMM / IPSJ-CSEC / IPSJ-SPT |
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Conference Date | 2018/7/25(2days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Sapporo Convention Center |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Security, etc. |
Chair | Tsutomu Matsumoto(Yokohama National Univ.) / Atsushi Fujioka(Kanagawa Univ.) / Tetsuya Morizumi(Kanagawa Univ.) / Yoshiaki Shiraishi(Kobe Univ.) / Keiichi Iwamura(TUC) |
Vice Chair | Shinichi Kawamura(Toshiba) / Makoto Ikeda(Univ. of Tokyo) / Shiho Moriai(NICT) / Shoichi Hirose(Univ. of Fukui) / Masaru Ogawa(Kobe Gakuin Univ.) / Takushi Otani(Kibi International Univ.) / Hiroki Takakura(NII) / Katsunari Yoshioka(Yokohama National Univ.) / Minoru Kuribayashi(Okayama Univ.) / Tetsuya Kojima(NIT,Tokyo College) |
Secretary | Shinichi Kawamura(Kobe Univ.) / Makoto Ikeda(SECOM) / Shiho Moriai(Tokai Univ.) / Shoichi Hirose(NICT) / Masaru Ogawa(Tokyo Univ. of the Arts) / Takushi Otani(Toyo Eiwa Univ.) / Hiroki Takakura(NTT) / Katsunari Yoshioka(NICT) / Minoru Kuribayashi(NIT, Tokyo) / Tetsuya Kojima(Tyukyo Univ.) |
Assistant | / Kazunari Omote(Tsukuba Univ.) / Yuuji Suga(IIJ) / Hisanori Kato(KDDI Research) / Nobuyuki Yoshinaga(Yamaguchi Pref Univ.) / Daisuke Suzuki(Hokuriku Univ.) / Akira Yamada(KDDI labs.) / Keisuke Kito(Mitsubishi Electric) / Hiroko Akiyama(National Institute of Technology, Nagano College) / キタヒロ カネダ(CANON) |
Paper Information | |
Registration To | Technical Committee on Hardware Security / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Enriched MultiMedia / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection |
Sub Title (in English) | |
Keyword(1) | Intentional Electromagnetic Interference |
Keyword(2) | Fault Injection Attack |
1st Author's Name | Takumi Okamoto |
1st Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
2nd Author's Name | Daisuke Fujimoto |
2nd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
3rd Author's Name | Yuichi Hayashi |
3rd Author's Affiliation | Nara Institute of Science and Technology(NAIST) |
4th Author's Name | Naofumi Homma |
4th Author's Affiliation | Tohoku University(Tohoku Univ.) |
5th Author's Name | Arthur Beckers |
5th Author's Affiliation | imec-COSIC KU Leuven(KU Leuven) |
6th Author's Name | Josep Balasch |
6th Author's Affiliation | imec-COSIC KU Leuven(KU Leuven) |
7th Author's Name | Benedikt Gierlichs |
7th Author's Affiliation | imec-COSIC KU Leuven(KU Leuven) |
8th Author's Name | Ingrid Verbauwhede |
8th Author's Affiliation | imec-COSIC KU Leuven(KU Leuven) |
Date | 2018-07-25 |
Paper # | ISEC2018-20,SITE2018-12,HWS2018-17,ICSS2018-23,EMM2018-19 |
Volume (vol) | vol.118 |
Number (no) | ISEC-151,SITE-152,HWS-153,ICSS-154,EMM-155 |
Page | pp.pp.77-81(ISEC), pp.77-81(SITE), pp.77-81(HWS), pp.77-81(ICSS), pp.77-81(EMM), |
#Pages | 5 |
Date of Issue | 2018-07-18 (ISEC, SITE, HWS, ICSS, EMM) |