Presentation 2018-07-25
Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection
Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi, Naofumi Homma, Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Fault injection attacks using intentional electromagnetic interference against cryptographic devices have been reported. When evaluating whether a device is a target of such a threat, traditionally, a method of directly tracing an attack meth-od has been used. For that reason, evaluation takes about the same time as the attack. In this paper, we propose a method to shorten the evaluation time using Gaussian noise. To evaluate whether the device is the subject of the threat de-scribed above, it is necessary to investigate whether there are frequencies causing a setup time violation in the crypto-graphic module from the outside the device. To find effective frequencies causing faults, conventionally, a wide fre-quency range was searched for sufficient time while changing the frequency step. On the other hand, in this paper, we inject Gaussian noise with broadband frequency components to the target equipment to eliminate frequency search and evaluate whether it is a threat target in a short time.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Intentional Electromagnetic Interference / Fault Injection Attack
Paper # ISEC2018-20,SITE2018-12,HWS2018-17,ICSS2018-23,EMM2018-19
Date of Issue 2018-07-18 (ISEC, SITE, HWS, ICSS, EMM)

Conference Information
Committee HWS / ISEC / SITE / ICSS / EMM / IPSJ-CSEC / IPSJ-SPT
Conference Date 2018/7/25(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Sapporo Convention Center
Topics (in Japanese) (See Japanese page)
Topics (in English) Security, etc.
Chair Tsutomu Matsumoto(Yokohama National Univ.) / Atsushi Fujioka(Kanagawa Univ.) / Tetsuya Morizumi(Kanagawa Univ.) / Yoshiaki Shiraishi(Kobe Univ.) / Keiichi Iwamura(TUC)
Vice Chair Shinichi Kawamura(Toshiba) / Makoto Ikeda(Univ. of Tokyo) / Shiho Moriai(NICT) / Shoichi Hirose(Univ. of Fukui) / Masaru Ogawa(Kobe Gakuin Univ.) / Takushi Otani(Kibi International Univ.) / Hiroki Takakura(NII) / Katsunari Yoshioka(Yokohama National Univ.) / Minoru Kuribayashi(Okayama Univ.) / Tetsuya Kojima(NIT,Tokyo College)
Secretary Shinichi Kawamura(Kobe Univ.) / Makoto Ikeda(SECOM) / Shiho Moriai(Tokai Univ.) / Shoichi Hirose(NICT) / Masaru Ogawa(Tokyo Univ. of the Arts) / Takushi Otani(Toyo Eiwa Univ.) / Hiroki Takakura(NTT) / Katsunari Yoshioka(NICT) / Minoru Kuribayashi(NIT, Tokyo) / Tetsuya Kojima(Tyukyo Univ.)
Assistant / Kazunari Omote(Tsukuba Univ.) / Yuuji Suga(IIJ) / Hisanori Kato(KDDI Research) / Nobuyuki Yoshinaga(Yamaguchi Pref Univ.) / Daisuke Suzuki(Hokuriku Univ.) / Akira Yamada(KDDI labs.) / Keisuke Kito(Mitsubishi Electric) / Hiroko Akiyama(National Institute of Technology, Nagano College) / キタヒロ カネダ(CANON)

Paper Information
Registration To Technical Committee on Hardware Security / Technical Committee on Information Security / Technical Committee on Social Implications of Technology and Information Ethics / Technical Committee on Information and Communication System Security / Technical Committee on Enriched MultiMedia / Special Interest Group on Computer Security / Special Interest Group on Security Psychology and Trust
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection
Sub Title (in English)
Keyword(1) Intentional Electromagnetic Interference
Keyword(2) Fault Injection Attack
1st Author's Name Takumi Okamoto
1st Author's Affiliation Nara Institute of Science and Technology(NAIST)
2nd Author's Name Daisuke Fujimoto
2nd Author's Affiliation Nara Institute of Science and Technology(NAIST)
3rd Author's Name Yuichi Hayashi
3rd Author's Affiliation Nara Institute of Science and Technology(NAIST)
4th Author's Name Naofumi Homma
4th Author's Affiliation Tohoku University(Tohoku Univ.)
5th Author's Name Arthur Beckers
5th Author's Affiliation imec-COSIC KU Leuven(KU Leuven)
6th Author's Name Josep Balasch
6th Author's Affiliation imec-COSIC KU Leuven(KU Leuven)
7th Author's Name Benedikt Gierlichs
7th Author's Affiliation imec-COSIC KU Leuven(KU Leuven)
8th Author's Name Ingrid Verbauwhede
8th Author's Affiliation imec-COSIC KU Leuven(KU Leuven)
Date 2018-07-25
Paper # ISEC2018-20,SITE2018-12,HWS2018-17,ICSS2018-23,EMM2018-19
Volume (vol) vol.118
Number (no) ISEC-151,SITE-152,HWS-153,ICSS-154,EMM-155
Page pp.pp.77-81(ISEC), pp.77-81(SITE), pp.77-81(HWS), pp.77-81(ICSS), pp.77-81(EMM),
#Pages 5
Date of Issue 2018-07-18 (ISEC, SITE, HWS, ICSS, EMM)