Presentation 2018-07-19
A Ka-band GaN Large-Signal Model Considering Trap Effect on Non-linear Capacitance by Using Transient S-parameters Measurement
Yutaro Yamaguchi, Tomohiro Otsuka, Masatake Hangai, Shintaro Shinjo, Toshiyuki Oishi,
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Abstract(in English)
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Paper # EMT2018-30,MW2018-45,OPE2018-33,EST2018-28,MWP2018-29
Date of Issue 2018-07-12 (EMT, MW, OPE, EST, MWP)

Conference Information
Committee EST / MW / OPE / MWP / EMT / IEE-EMT
Conference Date 2018/7/19(2days)
Place (in Japanese) (See Japanese page)
Place (in English)
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Chair Akimasa Hirata(Nagoya Inst. of Tech.) / Masahiro Muraguchi(TUS) / Kouki Sato(Furukawa Electric Industries) / Tetsuya Kawanishi(Waseda Univ.) / Akira Hirose(Univ. of Tokyo) / Keiji Goto(National Defense Academy)
Vice Chair Shinichiro Ohnuki(Nihon Univ.) / Masayuki Kimishima(Advantest) / Jun Shibayama(Hosei Univ.) / Yoshinori Kogami(Utsunomiya Univ.) / Hiroshi Okazaki(NTT DOCOMO) / Kenichi Tajima(Mitsubishi Electric) / Hiroshi Takahashi(Sophia Univ.) / Naoto Yoshimoto(Chitose Inst. of Science and Tech.) / Koichi Hirayama(Kitami Inst. of Tech.)
Secretary Shinichiro Ohnuki(CIST) / Masayuki Kimishima(National Inst. of Tech.,Sendai College) / Jun Shibayama(HITACHI) / Yoshinori Kogami(Utsunomiya Univ.) / Hiroshi Okazaki(Univ. of Tokyo) / Kenichi Tajima(NICT) / Hiroshi Takahashi(NICT) / Naoto Yoshimoto(Chiba Inst. of Tech.) / Koichi Hirayama(Tokyo Metro. Coll. of Tech) / (Fukuoka Inst.of Tech.)
Assistant Takahiro Ito(Nagoya Inst. of Tech.) / Kazuhiro Fujita(Fujitsu) / Mizuki Motoyoshi(Tohoku Univ.) / Satoshi Yoshida(Kagoshima Univ.) / Yuya Shoji(Tokyo Inst. of Tech.) / Kazunori Seno(NTT) / Kensuke Ikeda(CRIEPI) / Kosuke Nishimura(KDDI Research) / Junichiro Sugisaka(Kitami Inst. of Tech.) / Yoshihiro Naka(Kyushu Univ. of Health and Welfare)

Paper Information
Registration To Technical Committee on Electronics Simulation Technology / Technical Committee on Microwaves / Technical Committee on OptoElectronics / Technical Committee on Microwave and Millimeter-wave Photonics / Technical Committee on Electromagnetic Theory / Technical Meeting on Electromagnetic Theory
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) A Ka-band GaN Large-Signal Model Considering Trap Effect on Non-linear Capacitance by Using Transient S-parameters Measurement
Sub Title (in English)
Keyword(1)
1st Author's Name Yutaro Yamaguchi
1st Author's Affiliation Mitsubishi Electric Corporation(Mitsubishi Electric Corp.)
2nd Author's Name Tomohiro Otsuka
2nd Author's Affiliation Mitsubishi Electric Corporation(Mitsubishi Electric Corp.)
3rd Author's Name Masatake Hangai
3rd Author's Affiliation Mitsubishi Electric Corporation(Mitsubishi Electric Corp.)
4th Author's Name Shintaro Shinjo
4th Author's Affiliation Mitsubishi Electric Corporation(Mitsubishi Electric Corp.)
5th Author's Name Toshiyuki Oishi
5th Author's Affiliation Saga University(Saga Univ.)
Date 2018-07-19
Paper # EMT2018-30,MW2018-45,OPE2018-33,EST2018-28,MWP2018-29
Volume (vol) vol.118
Number (no) EMT-141,MW-142,OPE-143,EST-144,MWP-145
Page pp.pp.125-130(EMT), pp.125-130(MW), pp.125-130(OPE), pp.125-130(EST), pp.125-130(MWP),
#Pages 6
Date of Issue 2018-07-12 (EMT, MW, OPE, EST, MWP)