Presentation 2018-06-25
XPS Study of Silicate Formation and Electrical Dipole at Y2O3/SiO2 Interfaces
Nobuyuki Fujimura, Akio Ohta, Mitsuhisa Ikeda, Katsunori Makihara, Seiichi Miyazaki,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # SDM2018-26
Date of Issue 2018-06-18 (SDM)

Conference Information
Committee SDM
Conference Date 2018/6/25(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Nagoya Univ. VBL3F
Topics (in Japanese) (See Japanese page)
Topics (in English) Material Science and Process Technology for MOS Devices and Memories
Chair Takahiro Shinada(Tohoku Univ.)
Vice Chair Hiroshige Hirano(TowerJazz Panasonic)
Secretary Hiroshige Hirano(Shizuoka Univ.)
Assistant Takahiro Mori(AIST) / Nobuaki Kobayashi(Nihon Univ.)

Paper Information
Registration To Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) XPS Study of Silicate Formation and Electrical Dipole at Y2O3/SiO2 Interfaces
Sub Title (in English)
Keyword(1)
1st Author's Name Nobuyuki Fujimura
1st Author's Affiliation Nagoya University(Nagoya Univ.)
2nd Author's Name Akio Ohta
2nd Author's Affiliation Nagoya University(Nagoya Univ.)
3rd Author's Name Mitsuhisa Ikeda
3rd Author's Affiliation Nagoya University(Nagoya Univ.)
4th Author's Name Katsunori Makihara
4th Author's Affiliation Nagoya University(Nagoya Univ.)
5th Author's Name Seiichi Miyazaki
5th Author's Affiliation Nagoya University(Nagoya Univ.)
Date 2018-06-25
Paper # SDM2018-26
Volume (vol) vol.118
Number (no) SDM-110
Page pp.pp.47-51(SDM),
#Pages 5
Date of Issue 2018-06-18 (SDM)