Presentation 2018-05-16
Pixel-based OPC using Quadratic Programming for Mask Optimization
Rina Azuma, Yukihide Kohira,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Due to continuous shrinking of Critical Dimensions (CD) in semiconductor manufacturing, advance of process technology in optical lithography is required. As a main stream among resolution enhance techniques to improve resolution, Optical Proximity Correction (OPC), which raises shape fidelity of formed patterns on wafers by mask correction to designed patterns, is essential to achieve scale down of CD in the optical lithography. In general, methods of mask correction by OPC are divided into two classes: rule-based OPC and model-based OPC. Recently, model-based OPC is broadly studied. Moreover, pixel-base OPC, which is one of model-base OPCs, decides opening or shielding part for each pixel in the mask and forms entire mask shape by mathematical models. This pixel-base OPC is known that it outputs very complicated mask geometry. In this paper, we propose process variation-aware pixel-based OPC which maximizes contrast of intensity around edges of target patterns by using Quadratic Programming.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) lithography / lithography simulation / optical proximity correction (OPC) / design for manufacturability (DFM)
Paper # VLD2018-3
Date of Issue 2018-05-09 (VLD)

Conference Information
Committee VLD / IPSJ-SLDM
Conference Date 2018/5/16(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kitakyushu International Conference Center
Topics (in Japanese) (See Japanese page)
Topics (in English) System Design, etc.
Chair Hiroyuki Ochi(Ritsumeikan Univ.) / Yutaka Tamiya(Fujitsu Laboratories)
Vice Chair Noriyuki Minegishi(Mitsubishi Electric)
Secretary Noriyuki Minegishi(Hiroshima City Univ.) / (NTT)
Assistant

Paper Information
Registration To Technical Committee on VLSI Design Technologies / Special Interest Group on System and LSI Design Methodology
Language ENG-JTITLE
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Pixel-based OPC using Quadratic Programming for Mask Optimization
Sub Title (in English)
Keyword(1) lithography
Keyword(2) lithography simulation
Keyword(3) optical proximity correction (OPC)
Keyword(4) design for manufacturability (DFM)
1st Author's Name Rina Azuma
1st Author's Affiliation The University of Aizu(Univ. of Aizu)
2nd Author's Name Yukihide Kohira
2nd Author's Affiliation The University of Aizu(Univ. of Aizu)
Date 2018-05-16
Paper # VLD2018-3
Volume (vol) vol.118
Number (no) VLD-29
Page pp.pp.31-36(VLD),
#Pages 6
Date of Issue 2018-05-09 (VLD)