Presentation 2018-05-16
Non-volatile Power Gating for Data Cache with Dynamic Line-selection
Sosuke Akiba, Kimiyoshi Usami,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) In the whole of CPU, the proportion of energy consumption of the cache is increasing. Non-volatile Power Gating(NVPG) is a technique of reducing the leakage power of the cache while keeping the stored data by applying the nonvolatile element MTJ to the SRAM that is constituting the cache. However, when PG is applied to data cache with Write-back writing system, there is a problem that information to be written in the main memory is lost and cache coherency cannot be maintained. In this paper, we examine the NVPG method applicable to the data cache that selects storage line based on decay miss density. Moreover, we evaluate the reduction of leakage power by the proposed method.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) Power-Gating / MTJ / data cache / Cache decay
Paper # VLD2018-2
Date of Issue 2018-05-09 (VLD)

Conference Information
Committee VLD / IPSJ-SLDM
Conference Date 2018/5/16(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kitakyushu International Conference Center
Topics (in Japanese) (See Japanese page)
Topics (in English) System Design, etc.
Chair Hiroyuki Ochi(Ritsumeikan Univ.) / Yutaka Tamiya(Fujitsu Laboratories)
Vice Chair Noriyuki Minegishi(Mitsubishi Electric)
Secretary Noriyuki Minegishi(Hiroshima City Univ.) / (NTT)
Assistant

Paper Information
Registration To Technical Committee on VLSI Design Technologies / Special Interest Group on System and LSI Design Methodology
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Non-volatile Power Gating for Data Cache with Dynamic Line-selection
Sub Title (in English)
Keyword(1) Power-Gating
Keyword(2) MTJ
Keyword(3) data cache
Keyword(4) Cache decay
1st Author's Name Sosuke Akiba
1st Author's Affiliation Shibaura Institute of Technology(SIT)
2nd Author's Name Kimiyoshi Usami
2nd Author's Affiliation Shibaura Institute of Technology(SIT)
Date 2018-05-16
Paper # VLD2018-2
Volume (vol) vol.118
Number (no) VLD-29
Page pp.pp.19-24(VLD),
#Pages 6
Date of Issue 2018-05-09 (VLD)