| Presentation | 2018-04-19 Four-terminal measurement of organic transistors fabricated by reverse offset printing Gaku Tsuburaoka, Hiroyuki Matsui, Yasunori Takeda, Tomoko Okamoto, Kousuke Tanabe, Shizuo Tokito, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Printing high resolution electrodes is an important technology for realizing the high integration of sensing devices and organic radio-frequency tags as well as for further improving the performance of organic transistors. Reverse offset printing method can form fine patterns of functional materials such as silver nanoparticles with a submicrometer line spacing at room temperature. As a method for forming the electrodes of organic transistors, it is possible to shorten the channel length by using the reverse offset printing method capable of high resolution printing. It enables high integration and high-speed operation of transistors. However, it is known that, as the channel length is shortened, the contact resistance at the electrode/semiconductor interface greatly affects the total resistance of devices and the mobility decreases. Transfer line method (TLM) is widely used as a method to estimate the magnitude of the contact resistance. However, resistance values can not be estimated accurately when the variation in transistor characteristics is large. In this research, the contact resistance and channel resistance were analyzed using four-terminal measurement which is one of the methods of estimating the contact resistance. It was found that the crystallinity of the channel material remarkably varies, depending on the conditions for adding the polymer material to semiconductor. In addition, correlation between the carrier injection property and the energy level of the electrodes was observed. The application of four-terminal measurement to printed devices in this research can be expected to be a major guideline for improving the performance of organic transistors. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | reverse offset printing / organic transistor / four-terminal measurement / contact resistance |
| Paper # | ED2018-2 |
| Date of Issue | 2018-04-12 (ED) |
| Conference Information | |
| Committee | ED |
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| Conference Date | 2018/4/19(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Kunio Tsuda(Toshiba) |
| Vice Chair | Michihiko Suhara(TMU) |
| Secretary | Michihiko Suhara(New JRC) |
| Assistant | Toshiyuki Oishi(Saga Univ.) / Tatsuya Iwata(TUT) |
| Paper Information | |
| Registration To | Technical Committee on Electron Devices |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Four-terminal measurement of organic transistors fabricated by reverse offset printing |
| Sub Title (in English) | |
| Keyword(1) | reverse offset printing |
| Keyword(2) | organic transistor |
| Keyword(3) | four-terminal measurement |
| Keyword(4) | contact resistance |
| 1st Author's Name | Gaku Tsuburaoka |
| 1st Author's Affiliation | Yamagata University(Yamagata Univ.) |
| 2nd Author's Name | Hiroyuki Matsui |
| 2nd Author's Affiliation | Yamagata University(Yamagata Univ.) |
| 3rd Author's Name | Yasunori Takeda |
| 3rd Author's Affiliation | Yamagata University(Yamagata Univ.) |
| 4th Author's Name | Tomoko Okamoto |
| 4th Author's Affiliation | DIC Corporation(DIC Corp.) |
| 5th Author's Name | Kousuke Tanabe |
| 5th Author's Affiliation | DIC Corporation(DIC Corp.) |
| 6th Author's Name | Shizuo Tokito |
| 6th Author's Affiliation | Yamagata University(Yamagata Univ.) |
| Date | 2018-04-19 |
| Paper # | ED2018-2 |
| Volume (vol) | vol.118 |
| Number (no) | ED-9 |
| Page | pp.pp.5-8(ED), |
| #Pages | 4 |
| Date of Issue | 2018-04-12 (ED) |