| Presentation | 2018-03-01 [Poster Presentation] A Study of Impedance Mismatch for S-parameter Measurement using Network Analyzer Takuichi Hirano, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | S parameters of high frequency circuits are measured by a network analyzer. Calibration is performed before measurement using the network analyzer in order to remove influences of secular change, temperature, moisture, etc. in the internal circuit and connected cables. Reference planes are determined by calibration. S parameters are calculated using waves passing through the reference planes. There are several methods in calibration such as the method using Open/Short/Load(Match)/Thru, which is referred to as SOLT or TOSM, the method using Thru/Reflect/Line, which is referred to as TRL, and the method called electronic calibration (ECal) which does not require replacement of calibration kits. Sometimes ripples are observed in S parameters of simple circuit although the influence of internal circuit and cables are removed by calibration. The cause of ripples is difficult to identify. A consideration on the cause of ripples will be presented and discussed. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Network Analyzer / S parameters / Measurement / Calibration / Ripple |
| Paper # | MW2017-185,ICD2017-109 |
| Date of Issue | 2018-02-22 (MW, ICD) |
| Conference Information | |
| Committee | ICD / MW |
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| Conference Date | 2018/3/1(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | The University of Shiga Prefecture |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave Integrated Circuit/Microwave Technologies |
| Chair | Hideto Hidaka(Renesas) / Masahiro Muraguchi(TUC) |
| Vice Chair | Makoto Nagata(Kobe Univ.) / Yoshinori Kogami(Utsunomiya Univ.) / Hiroshi Okazaki(NTTdocomo) / Kenichi Tajima(Mitsubishi Electric) |
| Secretary | Makoto Nagata(Univ. of Tokyo) / Yoshinori Kogami(Panasonic) / Hiroshi Okazaki(Tokyo Inst. of Tech.) / Kenichi Tajima(HITACHI) |
| Assistant | Masanori Natsui(Tohoku Univ.) / Masatoshi Tsuge(Socionext) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Satoshi Ono(Univ. of Electro-Comm.) / Mizuki Motoyoshi(Tohoku Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Integrated Circuits and Devices / Technical Committee on Microwaves |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | [Poster Presentation] A Study of Impedance Mismatch for S-parameter Measurement using Network Analyzer |
| Sub Title (in English) | |
| Keyword(1) | Network Analyzer |
| Keyword(2) | S parameters |
| Keyword(3) | Measurement |
| Keyword(4) | Calibration |
| Keyword(5) | Ripple |
| 1st Author's Name | Takuichi Hirano |
| 1st Author's Affiliation | Tokyo Institute of Technology(Tokyo Tech) |
| Date | 2018-03-01 |
| Paper # | MW2017-185,ICD2017-109 |
| Volume (vol) | vol.117 |
| Number (no) | MW-462,ICD-463 |
| Page | pp.pp.55-55(MW), pp.55-55(ICD), |
| #Pages | 1 |
| Date of Issue | 2018-02-22 (MW, ICD) |