| Presentation | 2018-03-02 Study on frequency dependence measurements of the interface relative conductivity using a dielectric rod resonator sandwiched between copper-clad dielectric substrates Yusaku Hirano, Takashi Shimizu, Yoshinori Kogami, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | We studied on evaluation techniques of the interface relative conductivity using a dielectric rod resonator sandwiched between copper-clad dielectric substrates. In this paper, we evaluated the frequency dependence of the interface relative conductivity of the copper-clad dielectric substrates in the frequency range of 3-30GHz using dielectric rods of (ZrSn)TiO4, Ba(MgTa)O3 and sapphire. As a result, we revealed that consideration of frequency dependence of loss tangent is important to calculate the measured value of the interface relative conductivity, and measurement accuracy is improved by using the corrected value of loss tangent in the measurement frequency of the interface relative conductivity. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Copper-clad dielectric substrate / Dielectric rod resonator / Interface relative conductivity / Microwave |
| Paper # | MW2017-191,ICD2017-115 |
| Date of Issue | 2018-02-22 (MW, ICD) |
| Conference Information | |
| Committee | ICD / MW |
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| Conference Date | 2018/3/1(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | The University of Shiga Prefecture |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Microwave Integrated Circuit/Microwave Technologies |
| Chair | Hideto Hidaka(Renesas) / Masahiro Muraguchi(TUC) |
| Vice Chair | Makoto Nagata(Kobe Univ.) / Yoshinori Kogami(Utsunomiya Univ.) / Hiroshi Okazaki(NTTdocomo) / Kenichi Tajima(Mitsubishi Electric) |
| Secretary | Makoto Nagata(Univ. of Tokyo) / Yoshinori Kogami(Panasonic) / Hiroshi Okazaki(Tokyo Inst. of Tech.) / Kenichi Tajima(HITACHI) |
| Assistant | Masanori Natsui(Tohoku Univ.) / Masatoshi Tsuge(Socionext) / Hiroyuki Ito(Tokyo Inst. of Tech.) / Pham Konkuha(Univ. of Electro-Comm.) / Satoshi Ono(Univ. of Electro-Comm.) / Mizuki Motoyoshi(Tohoku Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Integrated Circuits and Devices / Technical Committee on Microwaves |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Study on frequency dependence measurements of the interface relative conductivity using a dielectric rod resonator sandwiched between copper-clad dielectric substrates |
| Sub Title (in English) | |
| Keyword(1) | Copper-clad dielectric substrate |
| Keyword(2) | Dielectric rod resonator |
| Keyword(3) | Interface relative conductivity |
| Keyword(4) | Microwave |
| 1st Author's Name | Yusaku Hirano |
| 1st Author's Affiliation | Utsunomiya University(Utsunomiya Univ.) |
| 2nd Author's Name | Takashi Shimizu |
| 2nd Author's Affiliation | Utsunomiya University(Utsunomiya Univ.) |
| 3rd Author's Name | Yoshinori Kogami |
| 3rd Author's Affiliation | Utsunomiya University(Utsunomiya Univ.) |
| Date | 2018-03-02 |
| Paper # | MW2017-191,ICD2017-115 |
| Volume (vol) | vol.117 |
| Number (no) | MW-462,ICD-463 |
| Page | pp.pp.83-86(MW), pp.83-86(ICD), |
| #Pages | 4 |
| Date of Issue | 2018-02-22 (MW, ICD) |