| Presentation | 2018-03-16 Relation between Voltage Fluctuations of Internal Terminals and Output Terminal of Linear Regulator Katsumasa Fujiki, Tohlu Matsushima, Takashi Hisakado, Osami Wada, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Immunity of voltage regulator when conducted disturbance is applied from supply voltage pin should be evaluated and simulated. In this report, immunity of an LDO voltage regulator, which is one of linear regulators, is focused. In this report, new ICIM-CI model considering internal voltage and/or current was proposed as expansion of original ICIM-CI standardized by IEC. The proposed model can be constructed by dividing the LDO voltage regulator into functional blocks. It was experimentally shown that the relationship between the voltage and/or current fluctuation of internal terminals and output voltage of the LDO voltage regulator. Furthermore, the output voltage predicted using the internal terminal voltage is in good agreement with measurement value in the frequency range of several 100 MHz. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Immunity macro model / ICIM-CI / LDO voltage regulator / functional block / conducted disturbance / internal terminal |
| Paper # | EMCJ2017-110 |
| Date of Issue | 2018-03-09 (EMCJ) |
| Conference Information | |
| Committee | EMCJ / MICT |
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| Conference Date | 2018/3/16(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | EMC |
| Chair | Osami Wada(Kyoto Univ.) / Masaru Sugimachi(National Cerebral and Cardiovascular Center) |
| Vice Chair | Kensei Oh(Nagoya Inst. of Tech.) / Shinsuke Hara(Osaka City Univ.) / Takahiro Aoyagi(Tokyo Inst. of Tech.) |
| Secretary | Kensei Oh(AIST) / Shinsuke Hara(Mitsubishi Electric) / Takahiro Aoyagi(Niigata Univ.) |
| Assistant | Shinichiro Yamamoto(Univ. of Hyogo) / Chie Sasaki(Panasonic) / Shinobu Nagasawa(Mitsubishi Electric) / Takumi Kobayashi(Yokohama National Univ.) / Shintaro Izumi(Kobe Univ.) / Tomoko Tateyama(Hiroshima Inst. of Tech.) / Ami Tanaka(Ritsumeikan Univ.) / Daisuke Anzai(Nagoya Inst. of Tech.) |
| Paper Information | |
| Registration To | Technical Committee on Electromagnetic Compatibility / Technical Committee on Healthcare and Medical Information Communication Technology |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Relation between Voltage Fluctuations of Internal Terminals and Output Terminal of Linear Regulator |
| Sub Title (in English) | |
| Keyword(1) | Immunity macro model |
| Keyword(2) | ICIM-CI |
| Keyword(3) | LDO voltage regulator |
| Keyword(4) | functional block |
| Keyword(5) | conducted disturbance |
| Keyword(6) | internal terminal |
| 1st Author's Name | Katsumasa Fujiki |
| 1st Author's Affiliation | Kyoto University(Kyoto Univ.) |
| 2nd Author's Name | Tohlu Matsushima |
| 2nd Author's Affiliation | Kyushu Institute of Technology(Kyutech) |
| 3rd Author's Name | Takashi Hisakado |
| 3rd Author's Affiliation | Kyoto University(Kyoto Univ.) |
| 4th Author's Name | Osami Wada |
| 4th Author's Affiliation | Kyoto University(Kyoto Univ.) |
| Date | 2018-03-16 |
| Paper # | EMCJ2017-110 |
| Volume (vol) | vol.117 |
| Number (no) | EMCJ-510 |
| Page | pp.pp.31-36(EMCJ), |
| #Pages | 6 |
| Date of Issue | 2018-03-09 (EMCJ) |