| Presentation | 2018-02-28 Artificial Intelligence Approach for Control of Quantized Conductance of Au Atomic Junctions Using Feedback-Controlled Electromigration Yuma Iwata, Shotaro Sakai, Noriaki Numakura, Jun-ichi Shirakashi, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Feedback controlled electromigration (FCE) methods have been developed to control electromigration and avoid catastrophic instability. The FCE procedure can successfully control metal nanowires with quantized conductance and make atomic junctions. FCE scheme is tuned by many parameters such as threshold differential conductance GTH, feedback voltage VFB, and voltage step VSTEP and so on. Therefore, it is necessary to optimize the FCE procedure according to the situation for precise and stable control of the quantized conductance of metal nanowires. However, the conventional system selects optimum parameters based on human experiments. This process may not necessarily be optimum for the FCE procedure. Hence, in order to address these problems, we focus on artificial intelligence (AI) approach. In this study, in order to realize AI approach for fabrication of nanoscale device, we designed intelligent control system for FCE. The system is composed by three kinds of AI engines that play a role in learning, evaluation and inference. These engines can determine the optimum VFB parameter without human intervention. Therefore, it is considered that intelligent control system allows us to improve the controllability of quantized conductance of Au atomic junctions with appropriate VFB parameters. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Electromigration / Atomic Junction / Artificial Intelligence |
| Paper # | ED2017-114,SDM2017-114 |
| Date of Issue | 2018-02-21 (ED, SDM) |
| Conference Information | |
| Committee | ED / SDM |
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| Conference Date | 2018/2/28(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Centennial Hall, Hokkaido Univ. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Functional nanodevices and related technologies |
| Chair | Kunio Tsuda(Toshiba) / Tatsuya Kunikiyo(Renesas) |
| Vice Chair | Michihiko Suhara(TMU) / Takahiro Shinada(Tohoku Univ.) |
| Secretary | Michihiko Suhara(New JRC) / Takahiro Shinada(NICT) |
| Assistant | Toshiyuki Oishi(Saga Univ.) / Tatsuya Iwata(TUT) / Hiroya Ikeda(Shizuoka Univ.) / Tetsu Morooka(TOSHIBA MEMORY) |
| Paper Information | |
| Registration To | Technical Committee on Electron Devices / Technical Committee on Silicon Device and Materials |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Artificial Intelligence Approach for Control of Quantized Conductance of Au Atomic Junctions Using Feedback-Controlled Electromigration |
| Sub Title (in English) | |
| Keyword(1) | Electromigration |
| Keyword(2) | Atomic Junction |
| Keyword(3) | Artificial Intelligence |
| 1st Author's Name | Yuma Iwata |
| 1st Author's Affiliation | Tokyo University of Agriculture and Technology(Tokyo Univ. of Agr. & Tech.) |
| 2nd Author's Name | Shotaro Sakai |
| 2nd Author's Affiliation | Tokyo University of Agriculture and Technology(Tokyo Univ. of Agr. & Tech.) |
| 3rd Author's Name | Noriaki Numakura |
| 3rd Author's Affiliation | Tokyo University of Agriculture and Technology(Tokyo Univ. of Agr. & Tech.) |
| 4th Author's Name | Jun-ichi Shirakashi |
| 4th Author's Affiliation | Tokyo University of Agriculture and Technology(Tokyo Univ. of Agr. & Tech.) |
| Date | 2018-02-28 |
| Paper # | ED2017-114,SDM2017-114 |
| Volume (vol) | vol.117 |
| Number (no) | ED-453,SDM-454 |
| Page | pp.pp.45-50(ED), pp.45-50(SDM), |
| #Pages | 6 |
| Date of Issue | 2018-02-21 (ED, SDM) |