| Presentation | 2018-02-20 Note on Weighted Fault Coverage for Two-Pattern Tests Masayuki Arai, Kazuhiko Iwasaki, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | hrinking feature size and higher integration on semiconductor device manufacturing technology bring a problem of the gap between the defect level estimated at the design stage from the reported one for fabricated devices. As one possible strategy to accurately estimate the defect level, authors have proposed weighted bridge/open fault coverage estimation, as well as test generation algorithms based on the weighted fault coverage. Previous work has only taken static fault models into account. In this study we introduce a fault model considering static and dynamic behavior of a defect, assuming that a part of behavior of a defect can only be observed as rise/fall delay. Targeting test pattern sets consisting of 2-pattern tests, we calculate weighted bridge/open fault coverage, and compare with conventional fault coverages based on delay and static fault models. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | weighted fault coverage / critical area / bridge fault / open fault / delay fault |
| Paper # | DC2017-77 |
| Date of Issue | 2018-02-13 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2018/2/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Chair | Michiko Inoue(NAIST) |
| Vice Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Secretary | Satoshi Fukumoto(Kyoto Sangyo Univ.) |
| Assistant | Masayuki Arai(Nihon Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Note on Weighted Fault Coverage for Two-Pattern Tests |
| Sub Title (in English) | |
| Keyword(1) | weighted fault coverage |
| Keyword(2) | critical area |
| Keyword(3) | bridge fault |
| Keyword(4) | open fault |
| Keyword(5) | delay fault |
| 1st Author's Name | Masayuki Arai |
| 1st Author's Affiliation | Nihon University(Nihon Univ.) |
| 2nd Author's Name | Kazuhiko Iwasaki |
| 2nd Author's Affiliation | Tokyo Metropolitan University(Tokyo Metro. Univ.) |
| Date | 2018-02-20 |
| Paper # | DC2017-77 |
| Volume (vol) | vol.117 |
| Number (no) | DC-444 |
| Page | pp.pp.1-6(DC), |
| #Pages | 6 |
| Date of Issue | 2018-02-13 (DC) |