Presentation 2018-02-28
Construction of simulation for analyzing thermal conduction in nanostructures
Naomi Yamashita, Yuya Ota, Ryo Nanao, Hiroshi Inokawa, Masaru Shimomura, Kenji Murakami, Hiroya Ikeda,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) With the aim of characterizing the thermal conductivity for nanometer-scale thermoelectric materials, we have constructed a new measurement system based on ac calorimetry. Analysis of the obtained data requires time-evolution of temperature distribution in nanometer-scale material under periodic heating. In this study, we made a simulation using a C#-program for time-dependent temperature distribution, based on 2-dimensional heat-diffusion equation including the influence of heat emission from material edges. The simulation was applied to AlN with millimeter-scale dimensions for confirming the validity and accuracy. The simulated thermal diffusivity for 10$times$75-mm$^{2}$-area AlN was 1.3x10^-4 m^2/s, which was larger than the value set in the heat-diffusion equation. This overestimation was also observed in the experiment. Therefore, our simulation can reproduce the unsteady heat conduction and be used for analyzing the ac calorimetry experiment.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) thermal diffusivity / ac calorimetry / heat diffusion equation / AlN
Paper # ED2017-112,SDM2017-112
Date of Issue 2018-02-21 (ED, SDM)

Conference Information
Committee ED / SDM
Conference Date 2018/2/28(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Centennial Hall, Hokkaido Univ.
Topics (in Japanese) (See Japanese page)
Topics (in English) Functional nanodevices and related technologies
Chair Kunio Tsuda(Toshiba) / Tatsuya Kunikiyo(Renesas)
Vice Chair Michihiko Suhara(TMU) / Takahiro Shinada(Tohoku Univ.)
Secretary Michihiko Suhara(New JRC) / Takahiro Shinada(NICT)
Assistant Toshiyuki Oishi(Saga Univ.) / Tatsuya Iwata(TUT) / Hiroya Ikeda(Shizuoka Univ.) / Tetsu Morooka(TOSHIBA MEMORY)

Paper Information
Registration To Technical Committee on Electron Devices / Technical Committee on Silicon Device and Materials
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Construction of simulation for analyzing thermal conduction in nanostructures
Sub Title (in English)
Keyword(1) thermal diffusivity
Keyword(2) ac calorimetry
Keyword(3) heat diffusion equation
Keyword(4) AlN
1st Author's Name Naomi Yamashita
1st Author's Affiliation Shizuoka University(Shizuoka Univ.)
2nd Author's Name Yuya Ota
2nd Author's Affiliation Shizuoka University(Shizuoka Univ.)
3rd Author's Name Ryo Nanao
3rd Author's Affiliation Shizuoka University(Shizuoka Univ.)
4th Author's Name Hiroshi Inokawa
4th Author's Affiliation Shizuoka University(Shizuoka Univ.)
5th Author's Name Masaru Shimomura
5th Author's Affiliation Shizuoka University(Shizuoka Univ.)
6th Author's Name Kenji Murakami
6th Author's Affiliation Shizuoka University(Shizuoka Univ.)
7th Author's Name Hiroya Ikeda
7th Author's Affiliation Shizuoka University(Shizuoka Univ.)
Date 2018-02-28
Paper # ED2017-112,SDM2017-112
Volume (vol) vol.117
Number (no) ED-453,SDM-454
Page pp.pp.35-38(ED), pp.35-38(SDM),
#Pages 4
Date of Issue 2018-02-21 (ED, SDM)