| Presentation | 2018-02-20 Investigation of a Measurement Method of Characteristic Variations in the FPGA Considering an LUT Structure Kouhei Satou, Yukiya Miura, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | FPGAs (Field Programmable Gate Arrays) are integrated circuits that can implement arbitrary logic functions by reconfiguration. In recent years, system development using FPGAs is increasing due to advantages such as shortening a development period and reducing a development cost using FPGAs. As device size of a semiconductors is shrinking, influence of characteristic variations and degradations of FPGA chips is becoming a serious problem. Therefore, in order to implement highly reliable digital systems using FPGAs, it is necessary to consider influence of characteristic variations and degradations. In this research, characteristic variations are measured by implementing ring oscillators (ROs) at several locations on the FPGA chip as with the LSI. After that, an oscillation frequency is measured. In the case of FPGAs, logic functions are implemented using LUTs (Look-Up Tables).Even with the same logic function, the LUT has many implementation methods. Oscillation frequencies were measured by several implementations, and features of each circuit and their usage were considered. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | FPGA / Ring Oscillator / Oscillating frequency / Variation / Characteristics / LUT |
| Paper # | DC2017-86 |
| Date of Issue | 2018-02-13 (DC) |
| Conference Information | |
| Committee | DC |
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| Conference Date | 2018/2/20(1days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | VLSI Design and Test, etc. |
| Chair | Michiko Inoue(NAIST) |
| Vice Chair | Satoshi Fukumoto(Tokyo Metropolitan Univ.) |
| Secretary | Satoshi Fukumoto(Kyoto Sangyo Univ.) |
| Assistant | Masayuki Arai(Nihon Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Dependable Computing |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Investigation of a Measurement Method of Characteristic Variations in the FPGA Considering an LUT Structure |
| Sub Title (in English) | |
| Keyword(1) | FPGA |
| Keyword(2) | Ring Oscillator |
| Keyword(3) | Oscillating frequency |
| Keyword(4) | Variation |
| Keyword(5) | Characteristics |
| Keyword(6) | LUT |
| 1st Author's Name | Kouhei Satou |
| 1st Author's Affiliation | Tokyo Metropolitan University(Tokyo Metropolitan Univ.) |
| 2nd Author's Name | Yukiya Miura |
| 2nd Author's Affiliation | Tokyo Metropolitan University(Tokyo Metropolitan Univ.) |
| Date | 2018-02-20 |
| Paper # | DC2017-86 |
| Volume (vol) | vol.117 |
| Number (no) | DC-444 |
| Page | pp.pp.55-60(DC), |
| #Pages | 6 |
| Date of Issue | 2018-02-13 (DC) |