| Presentation | 2018-01-30 Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation Hiroshi Nakao, Yu Yonezawa, Yoshiyasu Nakashima, Fujio Kurokawa, |
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| PDF Download Page |  PDF download Page Link |
| Abstract(in Japanese) | (See Japanese page) |
| Abstract(in English) | Electrolytic capacitors are known as one of the highest failure rate components in switching mode power supply SMPS). We found low stability phenomenon of digitally controlled SMPS caused by capacitor equivalent serial resistance (ESR) degradation. This low stability phenomenon is digitally control oriented and suitable for degradation detection or failure prediction of electrolytic capacitor. |
| Keyword(in Japanese) | (See Japanese page) |
| Keyword(in English) | Digitally controlled SMPS / Electrolytic capacitor / degradation detection / failure prediction / low stability phenomenon |
| Paper # | EE2017-71 |
| Date of Issue | 2018-01-22 (EE) |
| Conference Information | |
| Committee | EE |
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| Conference Date | 2018/1/29(2days) |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Satellite Campus Oita |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Chair | Fujio Kurokawa(Nagasaki Univ.) |
| Vice Chair | Masatoshi Nakahara(Sojo Univ.) / Keiichi Hirose(NTT-F) |
| Secretary | Masatoshi Nakahara(Fukuoka Univ.) / Keiichi Hirose |
| Assistant | kazuhiro Kajiwara(NiAS) / Takashi Matsushita(NTT-F) / Hidenori Maruta(Nagasaki Univ.) |
| Paper Information | |
| Registration To | Technical Committee on Energy Engineering in Electronics and Communications |
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| Language | JPN |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation |
| Sub Title (in English) | |
| Keyword(1) | Digitally controlled SMPS |
| Keyword(2) | Electrolytic capacitor |
| Keyword(3) | degradation detection |
| Keyword(4) | failure prediction |
| Keyword(5) | low stability phenomenon |
| 1st Author's Name | Hiroshi Nakao |
| 1st Author's Affiliation | Fujitsu Laboratories LTD.(Fujitsu LAB) |
| 2nd Author's Name | Yu Yonezawa |
| 2nd Author's Affiliation | Fujitsu Laboratories LTD.(Fujitsu LAB) |
| 3rd Author's Name | Yoshiyasu Nakashima |
| 3rd Author's Affiliation | Fujitsu Laboratories LTD.(Fujitsu LAB) |
| 4th Author's Name | Fujio Kurokawa |
| 4th Author's Affiliation | The Nagasaki Institute of Applied Science(NiAS) |
| Date | 2018-01-30 |
| Paper # | EE2017-71 |
| Volume (vol) | vol.117 |
| Number (no) | EE-424 |
| Page | pp.pp.165-170(EE), |
| #Pages | 6 |
| Date of Issue | 2018-01-22 (EE) |