Presentation 2018-01-30
Measurement of Switching Characteristics and Drain-Gate Interaction of SiC-MOSFET
Daiki Taniguchi, Tetsuro Tanaka,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English)
Keyword(in Japanese) (See Japanese page)
Keyword(in English)
Paper # EE2017-68
Date of Issue 2018-01-22 (EE)

Conference Information
Committee EE
Conference Date 2018/1/29(2days)
Place (in Japanese) (See Japanese page)
Place (in English) Satellite Campus Oita
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Fujio Kurokawa(Nagasaki Univ.)
Vice Chair Masatoshi Nakahara(Sojo Univ.) / Keiichi Hirose(NTT-F)
Secretary Masatoshi Nakahara(Fukuoka Univ.) / Keiichi Hirose
Assistant kazuhiro Kajiwara(NiAS) / Takashi Matsushita(NTT-F) / Hidenori Maruta(Nagasaki Univ.)

Paper Information
Registration To Technical Committee on Energy Engineering in Electronics and Communications
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Measurement of Switching Characteristics and Drain-Gate Interaction of SiC-MOSFET
Sub Title (in English)
Keyword(1)
1st Author's Name Daiki Taniguchi
1st Author's Affiliation Kagoshima University(Kagoshima Univ.)
2nd Author's Name Tetsuro Tanaka
2nd Author's Affiliation Kagoshima University(Kagoshima Univ.)
Date 2018-01-30
Paper # EE2017-68
Volume (vol) vol.117
Number (no) EE-424
Page pp.pp.151-156(EE),
#Pages 6
Date of Issue 2018-01-22 (EE)