Presentation 2018-01-31
Fundamental investigation on characteristic change of YBCO thin films by focused ion beam processing
Yuji Miyato,
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Abstract(in Japanese) (See Japanese page)
Abstract(in English) Recently, the focused ion beam processing of YBCO thin films, leading to the local change of the superconducting characteristics, has attracted the researchers’ attention as a fabrication method of Josephson junctions. In this study, it was confirmed that the irradiation of helium or neon ion beams brought the change of YBCO film characteristics into insulating behavior or the decrease of the critical temperature, and that the critical temperature come back close to the initial value due to the recovery from the irradiation damage after annealing in an oxygen atmosphere. The experiment results were also analyzed by means of a Monte Carlo method, simulating how the incident ion could introduce the damage into the films.
Keyword(in Japanese) (See Japanese page)
Keyword(in English) YBCO thin films / focused ion beam / Josephson junction
Paper # SCE2017-35
Date of Issue 2018-01-24 (SCE)

Conference Information
Committee SCE
Conference Date 2018/1/31(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English) SQUID, high frequency, sensing technologies and their applications, etc.
Chair Hiroaki Myoren(Saitama Univ.)
Vice Chair
Secretary (National Defense Academy)
Assistant Hiroyuki Akaike(Daido Univ.)

Paper Information
Registration To Technical Committee on Superconductive Electronics
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) Fundamental investigation on characteristic change of YBCO thin films by focused ion beam processing
Sub Title (in English)
Keyword(1) YBCO thin films
Keyword(2) focused ion beam
Keyword(3) Josephson junction
1st Author's Name Yuji Miyato
1st Author's Affiliation Osaka University(Osaka Univ.)
Date 2018-01-31
Paper # SCE2017-35
Volume (vol) vol.117
Number (no) SCE-428
Page pp.pp.21-26(SCE),
#Pages 6
Date of Issue 2018-01-24 (SCE)