Presentation 2017-12-15
An overview of IEC 62856 Open systems dependability
Yoshiki Kinoshita, Makoto Takeyama,
PDF Download Page PDF download Page Link
Abstract(in Japanese) (See Japanese page)
Abstract(in English) IEC 62853 Open systems dependability, which is being developed by IEC TC56 at the stage of AFDIS (Approved for Final Draft International Standard) as of September 2017, is overviewed based on its committee draft for vote (CDV).
Keyword(in Japanese) (See Japanese page)
Keyword(in English) open system / open systems dependability / dependability case
Paper # R2017-59
Date of Issue 2017-12-08 (R)

Conference Information
Committee R
Conference Date 2017/12/15(1days)
Place (in Japanese) (See Japanese page)
Place (in English) Kikai-Shinko-Kaikan Bldg.
Topics (in Japanese) (See Japanese page)
Topics (in English)
Chair Tetsushi Yuge(National Defense Academy)
Vice Chair Akira Asato(Fujitsu)
Secretary Akira Asato(Hosei Univ.)
Assistant Shinji Inoue(Kansai Univ.) / Hiroyuki Okamura(Hiroshima Univ.)

Paper Information
Registration To Technical Committee on Reliability
Language JPN
Title (in Japanese) (See Japanese page)
Sub Title (in Japanese) (See Japanese page)
Title (in English) An overview of IEC 62856 Open systems dependability
Sub Title (in English) Consensus Building, Accountability Achievement, Failure Response and Change Accommodation
Keyword(1) open system
Keyword(2) open systems dependability
Keyword(3) dependability case
1st Author's Name Yoshiki Kinoshita
1st Author's Affiliation Kanagawa University(KU)
2nd Author's Name Makoto Takeyama
2nd Author's Affiliation Kanagawa University(KU)
Date 2017-12-15
Paper # R2017-59
Volume (vol) vol.117
Number (no) R-355
Page pp.pp.19-23(R),
#Pages 5
Date of Issue 2017-12-08 (R)