Presentation | 2017-12-22 Conduction mechanisms in heavily Al-doped 4H-SiC epilayers Shinji Ozawa, Akinobu Takeshita, TAtsuya imamura, Kota Takano, Kazuya Okuda, Atsuki Hidaka, Hideharu Matsuura, Shiyang Ji, Kazuma Eto, Kazuoshi Kojima, Tomohisa Kato, Sadafumi Yoshida, Hajime Okumura, |
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PDF Download Page | PDF download Page Link |
Abstract(in Japanese) | (See Japanese page) |
Abstract(in English) | To realize SiC n-channel insulated gate bipolar transistors (IGBTs) with very low on-resistance, it is essential to reduce the resistance in thick p+-type SiC substrates that are collectors of n-channel IGBTs. However, it is not clear that the relationships between its conduction mechanisms and Al concentration or measurement temperature in heavily Al-doped 4H-SiC. Therefore, we measured the temperature-dependent resistivity in heavily-doped 4H-SiC with several Al concentrations by a van der Pauw method, and then elucidated the relationships. |
Keyword(in Japanese) | (See Japanese page) |
Keyword(in English) | SiC IGBT / p-type 4H-SiC / Heavily Al-doped 4H-SiC / Temperature-dependent resistivity / Conduction mechanism |
Paper # | EID2017-12,SDM2017-73 |
Date of Issue | 2017-12-15 (EID, SDM) |
Conference Information | |
Committee | SDM / EID |
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Conference Date | 2017/12/22(1days) |
Place (in Japanese) | (See Japanese page) |
Place (in English) | Kyoto University |
Topics (in Japanese) | (See Japanese page) |
Topics (in English) | Si, Si-related materials, device process, electron devices, and display technology |
Chair | Tatsuya Kunikiyo(Renesas) / Yuko Kominami(Shizuoka Univ.) |
Vice Chair | Takahiro Shinada(Tohoku Univ.) / Mutsumi Kimura(Ryukoku Univ.) |
Secretary | Takahiro Shinada(Tohoku Univ.) / Mutsumi Kimura(Renesas) |
Assistant | Hiroya Ikeda(Shizuoka Univ.) / Tetsu Morooka(TOSHIBA MEMORY) / Rumiko Yamaguchi(Akita Univ.) / Hiroyuki Nitta(Japan Display) / Mitsuru Nakata(NHK) / Ryosuke Nonaka(Toshiba) / Takeshi Okuno(Huawei) / Tomokazu Shiga(Univ. of Electro-Comm.) |
Paper Information | |
Registration To | Technical Committee on Silicon Device and Materials / Technical Committee on Electronic Information Displays |
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Language | JPN |
Title (in Japanese) | (See Japanese page) |
Sub Title (in Japanese) | (See Japanese page) |
Title (in English) | Conduction mechanisms in heavily Al-doped 4H-SiC epilayers |
Sub Title (in English) | Dependencies of resistivity on Al concentration and temperature |
Keyword(1) | SiC IGBT |
Keyword(2) | p-type 4H-SiC |
Keyword(3) | Heavily Al-doped 4H-SiC |
Keyword(4) | Temperature-dependent resistivity |
Keyword(5) | Conduction mechanism |
1st Author's Name | Shinji Ozawa |
1st Author's Affiliation | Osaka Electro-Communication University(OECU) |
2nd Author's Name | Akinobu Takeshita |
2nd Author's Affiliation | Osaka Electro-Communication University(OECU) |
3rd Author's Name | TAtsuya imamura |
3rd Author's Affiliation | Osaka Electro-Communication University(OECU) |
4th Author's Name | Kota Takano |
4th Author's Affiliation | Osaka Electro-Communication University(OECU) |
5th Author's Name | Kazuya Okuda |
5th Author's Affiliation | Osaka Electro-Communication University(OECU) |
6th Author's Name | Atsuki Hidaka |
6th Author's Affiliation | Osaka Electro-Communication University(OECU) |
7th Author's Name | Hideharu Matsuura |
7th Author's Affiliation | Osaka Electro-Communication University(OECU) |
8th Author's Name | Shiyang Ji |
8th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
9th Author's Name | Kazuma Eto |
9th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
10th Author's Name | Kazuoshi Kojima |
10th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
11th Author's Name | Tomohisa Kato |
11th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
12th Author's Name | Sadafumi Yoshida |
12th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
13th Author's Name | Hajime Okumura |
13th Author's Affiliation | National Institute of Advanced Industrial Science and Technology(AIST) |
Date | 2017-12-22 |
Paper # | EID2017-12,SDM2017-73 |
Volume (vol) | vol.117 |
Number (no) | EID-372,SDM-373 |
Page | pp.pp.5-8(EID), pp.5-8(SDM), |
#Pages | 4 |
Date of Issue | 2017-12-15 (EID, SDM) |